5GAM

Foot region of the yeast spliceosomal U4/U6.U5 tri-snRNP

ELECTRON MICROSCOPY

---

Refinement

RMS Deviations
Key	Refinement Restraint Deviation
r_long_range_B_refined	41.905
r_long_range_B_other	41.905
r_dihedral_angle_2_deg	33.962
r_scangle_other	32.512
r_mcangle_it	31.175
r_mcangle_other	31.174
r_mcbond_other	20.725
r_mcbond_it	20.724
r_scbond_it	20.398
r_scbond_other	20.397
r_dihedral_angle_3_deg	17.525
r_dihedral_angle_4_deg	12.922
r_dihedral_angle_1_deg	12.837
r_angle_refined_deg	1.388
r_angle_other_deg	1.047
r_chiral_restr	0.22
r_bond_refined_d	0.007
r_gen_planes_refined	0.007
r_bond_other_d	0.002
r_gen_planes_other	0.002
r_nbd_refined
r_nbd_other
r_nbtor_refined
r_nbtor_other
r_xyhbond_nbd_refined
r_xyhbond_nbd_other
r_metal_ion_refined
r_metal_ion_other
r_symmetry_vdw_refined
r_symmetry_vdw_other
r_symmetry_hbond_refined
r_symmetry_hbond_other
r_symmetry_metal_ion_refined
r_symmetry_metal_ion_other
r_scangle_it
r_rigid_bond_restr
r_sphericity_free
r_sphericity_bonded

Sample
Foot region of the yeast spliceosomal U4/U6.U5 tri-snRNP

Specimen Preparation
Sample Aggregation State	PARTICLE

3D Reconstruction
Reconstruction Method	SINGLE PARTICLE
Number of Particles	140155
Reported Resolution (Å)	3.7
Resolution Method	FSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry Type	POINT
Point Symmetry	C1

Map-Model Fitting and Refinement
Id	1
Refinement Space	RECIPROCAL
Refinement Protocol
Refinement Target
Overall B Value
Fitting Procedure
Details

Data Acquisition
Detector Type	GATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å**2)	38

Imaging Experiment	1
Date of Experiment
Temperature (Kelvin)
Microscope Model	FEI TITAN KRIOS
Minimum Defocus (nm)	500
Maximum Defocus (nm)	3500
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS	2
Imaging Mode	BRIGHT FIELD
Specimen Holder Model	FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification	81000
Calibrated Magnification	35714
Source	FIELD EMISSION GUN
Acceleration Voltage (kV)	300
Imaging Details

EM Software
Task	Software Package	Version
PARTICLE SELECTION	RELION
IMAGE ACQUISITION	DigitalMicrograph
CTF CORRECTION	CTFFIND	4
MODEL FITTING	Coot	0.8.3
MODEL REFINEMENT	REFMAC	5.8
INITIAL EULER ASSIGNMENT	RELION
FINAL EULER ASSIGNMENT	RELION
CLASSIFICATION	RELION
RECONSTRUCTION	RELION

Image Processing
CTF Correction Type	CTF Correction Details	Number of Particles Selected	Particle Selection Details
PHASE FLIPPING ONLY		473827