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Structure of CaSTS from multi-crystal white beam Laue diffraction


X-RAY DIFFRACTION

Serial Crystallography (SX)

Serial Crystallography (SX)

Starting Model(s)

Initial Refinement Model(s)
TypeSourceAccession CodeDetails
experimental modelPDB 9UU8 

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1VAPOR DIFFUSION, SITTING DROP72891.0 M sodium citrate tribasic, pH 7.0
Crystal Properties
Matthews coefficientSolvent content
3.7467.17

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 105.2α = 90
b = 139.7β = 90
c = 179.3γ = 90
Symmetry
Space GroupI 2 2 2

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray298PIXELDECTRIS PILATUS 2M2024-06-17LLAUE
31x-ray298PIXELDECTRIS PILATUS 2M2025-04-03LLAUE
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRONSSRF BEAMLINE BL03HB0.55-1.58SSRFBL03HB
3SYNCHROTRONSSRF BEAMLINE BL03HB0.55-1.58SSRFBL03HB

Serial Crystallography

Sample delivery method
Diffraction IDDescriptionSample Delivery Method
1in situ fixed target in MiTeGen In Situ-1 Crystallization Platefixed target
3in situ fixed target in MiTeGen In Situ-1 Crystallization Platefixed target
Fixed Target
Diffraction IDDescriptionSample HoldingSupport BaseMotion controlDetails Sample Solvent
1Sample crystallized via manual pipetting setup in MiTeGen In Situ-1 Crystallization Plate
3Sample crystallized via manual pipetting setup in MiTeGen In Situ-1 Crystallization Plate
Data Reduction
Diffraction IDFrames IndexedCrystal HitsFrames IndexedLatices Merged
14646

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Merge I (Observed)CC (Half)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
12.542.5878.70.2040.95.45.935695
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)R Merge I (Observed)CC (Half)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
12.52.668.50.3280.5472.13.3

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodResolution (High)Resolution (Low)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (All)R-Work (Depositor)R-Work (DCC)R-Free (Depositor)R-Free (DCC)Mean Isotropic B
X-RAY DIFFRACTIONMOLECULAR REPLACEMENTFREE R-VALUE2.542.5835638178977.4910.2580.25620.26040.29460.29834.478
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
-0.778-0.0150.793
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms6051
Nucleic Acid Atoms
Solvent Atoms92
Heterogen Atoms

Software

Software
Software NamePurpose
REFMACrefinement
Laueprocessdata reduction
Aimlessdata scaling
PHASERphasing