ELECTRON CRYSTALLOGRAPHY
Crystallization
| Crystalization Experiments | ||||
|---|---|---|---|---|
| ID | Method | pH | Temperature | Details |
| 1 | naturally occurring in vivo | 7 | 310 | crystal size is increased by fusion and annealing using detergents, pH 7, naturally occurring in vivo, temperature 37K |
Crystal Data
| Unit Cell | |
|---|---|
| Length ( Å ) | Angle ( ˚ ) |
| a = 62.45 | α = 90 |
| b = 62.45 | β = 90 |
| c = 100.9 | γ = 120 |
| Symmetry | |
|---|---|
| Space Group | P 3 |
Diffraction
| Diffraction Experiment | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
| 1 | 1 | electron | 93 | FILM | OTHER | 1986-01-01 | M | SINGLE WAVELENGTH | ||||||
| Radiation Source | |||||
|---|---|---|---|---|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
| 1 | ELECTRON MICROSCOPE | OTHER | |||
Data Collection
| Overall | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | ||||||||
| 1 | 3.2 | 200 | 65.1 | 0.173 | 7297 | 4749 | |||||||||||||
Refinement
| Statistics | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Diffraction ID | Structure Solution Method | Resolution (High) | Resolution (Low) | Number Reflections (All) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Work (Depositor) | R-Free (Depositor) | R-Free Selection Details | Mean Isotropic B | ||||||||
| ELECTRON CRYSTALLOGRAPHY | 3.2 | 200 | 7297 | 4749 | 514 | 65.1 | 0.239 | 0.31 | RANDOM | ||||||||||
| Temperature Factor Modeling | ||||||
|---|---|---|---|---|---|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation |
| c_angle_deg | 1.4 |
| c_bond_d | 0.009 |
| Non-Hydrogen Atoms Used in Refinement | |
|---|---|
| Non-Hydrogen Atoms | Number |
| Protein Atoms | 1733 |
| Nucleic Acid Atoms | |
| Solvent Atoms | |
| Heterogen Atoms | 20 |
Software
| Software | |
|---|---|
| Software Name | Purpose |
| CNS | refinement |
| Sample |
|---|
| Bacteriorhodopsin |
| Specimen Preparation | |
|---|---|
| Sample Aggregation State | 2D ARRAY |
| 3D Reconstruction | |
|---|---|
| Reconstruction Method | CRYSTALLOGRAPHY |
| Data Acquisition | |||||||||
|---|---|---|---|---|---|---|---|---|---|
| Detector Type | GENERIC FILM | GENERIC FILM | GENERIC FILM | ||||||
| Electron Dose (electrons/Å**2) | 20 | 15 | |||||||
| Imaging Experiment | 1 | 2 | 3 |
|---|---|---|---|
| Date of Experiment | |||
| Temperature (Kelvin) | |||
| Microscope Model | FEI/PHILIPS EM420 | SIEMENS SULEIKA | JEOL 100B |
| Minimum Defocus (nm) | |||
| Maximum Defocus (nm) | |||
| Minimum Tilt Angle (degrees) | |||
| Maximum Tilt Angle (degrees) | |||
| Nominal CS | |||
| Imaging Mode | DIFFRACTION | BRIGHT FIELD | BRIGHT FIELD |
| Specimen Holder Model | |||
| Nominal Magnification | 66000 | 55000 | |
| Calibrated Magnification | |||
| Source | FIELD EMISSION GUN | ||
| Acceleration Voltage (kV) | 120 | 100 | 100 |
| Imaging Details | 60 degree tilted specimens | 0, 20, 45 degree + random degree tilts | , 20, 45 degree + random degree tilts |














