X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1VAPOR DIFFUSION, HANGING DROP7.529150 mM NaCL, 10mM Tris-HCl pH 7.5, 225 mM NH4NO3, 20% PEG 3500, VAPOR DIFFUSION, HANGING DROP, temperature 291K
2VAPOR DIFFUSION, HANGING DROP7.529150 mM NaCL, 10mM Tris-HCl pH 7.5, 50mM NaNO3, 20% PEG 3500, 10mM K2Pt(CN4), VAPOR DIFFUSION, HANGING DROP, temperature 291K
3VAPOR DIFFUSION, HANGING DROP7.529150 mM NaCL, 10mM Tris-HCl pH 7.5, 50mM NaNO3, 20% PEG 3500, 10 mM K2PtCl4, VAPOR DIFFUSION, HANGING DROP, temperature 291K
4VAPOR DIFFUSION, HANGING DROP7.529150 mM NaCL, 10mM Tris-HCl pH 7.5, 50mM NaNO3, 20% PEG 3500, 10 mM NaWO4, VAPOR DIFFUSION, HANGING DROP, temperature 291K

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 43.513α = 91.57
b = 49.624β = 99.75
c = 120.35γ = 113.48
Symmetry
Space GroupP 1

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray100CCDADSC QUANTUM 315r2007-04-20MSINGLE WAVELENGTH
21x-ray100CCDADSC QUANTUM 315r2007-05-09MSINGLE WAVELENGTH
31x-ray100CCDADSC QUANTUM 315r2007-05-09MSINGLE WAVELENGTH
41x-ray100CCDADSC QUANTUM 315r2007-05-09MSINGLE WAVELENGTH
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRONALS BEAMLINE 8.3.11.1ALS8.3.1
2SYNCHROTRONALS BEAMLINE 8.3.11.071ALS8.3.1
3SYNCHROTRONALS BEAMLINE 8.3.11.071ALS8.3.1
4SYNCHROTRONALS BEAMLINE 8.3.11.214ALS8.3.1

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Merge I (Observed)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
1,2,3,41.340.85193.60.03128.23.4222500208073-315.36
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)R Merge I (Observed)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
1.31.31584.80.3572.42.518736

Refinement

Statistics
Diffraction IDStructure Solution MethodResolution (High)Resolution (Low)Number Reflections (All)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
X-RAY DIFFRACTIONMIRAS1.300440.8512225002080731045193.510.17340.17250.1894random, 5%
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
-0.45131.32910.04361.8789-1.5534-1.4276
RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d15.415
f_angle_d1.501
f_chiral_restr0.089
f_bond_d0.014
f_plane_restr0.008
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms6489
Nucleic Acid Atoms
Solvent Atoms948
Heterogen Atoms70

Software

Software
Software NamePurpose
HKL-2000data collection
SOLVEphasing
PHENIXrefinement
HKL-2000data reduction
SCALAdata scaling