X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1VAPOR DIFFUSION, HANGING DROP629113-18% v/v 2-methyl-2,4-pentanediol (MPD), 2-5% w/v PEG 6000, and 0.1M bis-tris, pH 6.0 , VAPOR DIFFUSION, HANGING DROP, temperature 291K
Crystal Properties
Matthews coefficientSolvent content
2.9558.28

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 131.3α = 90
b = 129.54β = 99.91
c = 184.78γ = 90
Symmetry
Space GroupP 1 21 1

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray100CCDMARMOSAIC 300 mm CCD2006-04-08MSINGLE WAVELENGTH
21x-ray100CCDMARMOSAIC 300 mm CCD2006-04-09MMAD
1,21
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRONAPS BEAMLINE 22-ID0.97931APS22-ID
2SYNCHROTRONAPS BEAMLINE 22-ID0.97931, 0.97942, 0.97175APS22-ID

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Sym I (Observed)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
1,23.245.699.70.073145.1100725100423-3
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)R-Sym I (Observed)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
1,23.23.2899.40.48323.96893

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodResolution (High)Resolution (Low)Number Reflections (All)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
X-RAY DIFFRACTIONMADTHROUGHOUT3.2209532095073500499.740.284920.284450.29373RANDOM150.132
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
0.282.463.46-2.89
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg23.883
r_dihedral_angle_4_deg13.787
r_dihedral_angle_3_deg10.857
r_dihedral_angle_1_deg2.212
r_angle_refined_deg1.307
r_symmetry_hbond_refined0.647
r_symmetry_vdw_refined0.505
r_nbtor_refined0.317
r_nbd_refined0.195
r_xyhbond_nbd_refined0.167
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg23.883
r_dihedral_angle_4_deg13.787
r_dihedral_angle_3_deg10.857
r_dihedral_angle_1_deg2.212
r_angle_refined_deg1.307
r_symmetry_hbond_refined0.647
r_symmetry_vdw_refined0.505
r_nbtor_refined0.317
r_nbd_refined0.195
r_xyhbond_nbd_refined0.167
r_chiral_restr0.093
r_bond_refined_d0.009
r_gen_planes_refined0.004
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms33009
Nucleic Acid Atoms
Solvent Atoms
Heterogen Atoms

Software

Software
Software NamePurpose
REFMACrefinement
MAR345data collection
XDSdata reduction
SCALAdata scaling
XDSdata scaling
SHELXCDphasing
SHELXEmodel building