1UCU

R-type straight flagellar filament made of full-length flagellin


ELECTRON MICROSCOPY
Sample
R-TYPE STRAIGHT FLAGELLAR FILAMENT
Specimen Preparation
Sample Aggregation StateFILAMENT
3D Reconstruction
Reconstruction MethodHELICAL
Number of Particles102
Reported Resolution (Å)4
Resolution Method
Other DetailsThe atomic model of a flagellin fragment F41 from Samatey et al (2001) NATURE 410 331-337 (PDB ENTRY 1IO1) was fitted to the density map using O. Then ...The atomic model of a flagellin fragment F41 from Samatey et al (2001) NATURE 410 331-337 (PDB ENTRY 1IO1) was fitted to the density map using O. Then, initial model of full-length flagellin was built by tracing missing terminal chains. The model was refined using both positional and simulated annealing refinements, by a molecular dynamics refinement program, FEX-PLOR, which we developed based on FX-PLOR for EM image analysis of the helical assembly. The amplitude-weighted phase-residual was implemented as an effective potential energy. The layer-line amplitude distributions of the EM data were then scaled to the structure factors calculated from the model based on their radial amplitude profiles obtained by averaging the amplitudes within each resolution shell. The density map was calculated again, and model building and refinement were iterated.
Refinement Type
Symmetry TypeHELICAL
Map-Model Fitting and Refinement
Id1 (1IO1)
Refinement SpaceRECIPROCAL
Refinement ProtocolFLEXIBLE FIT
Refinement Targetamplitude-weighted phase residual
Overall B Value
Fitting Procedure
DetailsREFINEMENT PROTOCOL--POSITIONAL AND SIMULATED ANNEALING
Data Acquisition
Detector TypeKODAK SO-163 FILM
Electron Dose (electrons/Å**2)20
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)4
Microscope ModelJEOL 3000SFF
Minimum Defocus (nm)1100
Maximum Defocus (nm)2200
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS1.6
Imaging ModeBRIGHT FIELD
Specimen Holder Model
Nominal Magnification50000
Calibrated Magnification47600
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
MODEL FITTINGX-PLOR
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
BOTH AMPLITUDE AND PHASE