X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 291.0
Details 0.3M NACL, 0.01 M TRIS-HCL 27,5 % (W/V) PEG 4K, PH 8

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 75.53 α = 90
b = 94.62 β = 90.39
c = 116.5 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS3 S 6M -- 2017-11-27
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.1 1.03320 BESSY 14.1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 50 99.5 -- -- -- 3.78 -- 151965 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.8 1.84 99.7 0.88 -- 1.55 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.8 45.972 -- 1.35 -- 150800 7540 99.47 -- 0.1425 0.142 0.1794 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8 1.845 -- 142 10599 0.2778 0.3288 -- 100.0
X Ray Diffraction 1.845 1.8949 -- 145 10623 0.2557 0.3037 -- 100.0
X Ray Diffraction 1.8949 1.9507 -- 138 10598 0.2311 0.3014 -- 100.0
X Ray Diffraction 1.9507 2.0136 -- 144 10592 0.2018 0.2572 -- 100.0
X Ray Diffraction 2.0136 2.0856 -- 140 10638 0.1828 0.2328 -- 100.0
X Ray Diffraction 2.0856 2.1691 -- 140 10590 0.1695 0.2178 -- 100.0
X Ray Diffraction 2.1691 2.2678 -- 142 10635 0.165 0.2339 -- 100.0
X Ray Diffraction 2.2678 2.3874 -- 144 10625 0.1604 0.2198 -- 100.0
X Ray Diffraction 2.3874 2.5369 -- 137 10664 0.1609 0.2084 -- 100.0
X Ray Diffraction 2.5369 2.7328 -- 143 10608 0.1566 0.2214 -- 99.0
X Ray Diffraction 2.7328 3.0078 -- 147 10672 0.1507 0.2179 -- 100.0
X Ray Diffraction 3.0078 3.4429 -- 142 10662 0.1282 0.1703 -- 99.0
X Ray Diffraction 3.4429 4.3371 -- 145 10557 0.1078 0.1112 -- 98.0
X Ray Diffraction 4.3371 45.9869 -- 142 10746 0.1112 0.1322 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.054
f_plane_restr 0.005
f_bond_d 0.007
f_angle_d 0.823
f_dihedral_angle_d 21.045
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 12778
Nucleic Acid Atoms 0
Heterogen Atoms 64
Solvent Atoms 434

Software

Software
Software Name Purpose
PHENIX refinement version: (1.12_2829: ???)
XDS data reduction
XSCALE data scaling
PHASER phasing