X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion
pH 8
Temperature 293.0

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 101.4 α = 90
b = 101.4 β = 90
c = 196.5 γ = 120
Symmetry
Space Group P 61 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RAYONIX MX-300 -- 2017-01-14
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08ID-1 0.97949 CLSI 08ID-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 36.48 99.97 -- -- -- 20.0 -- 56003 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.8 1.864 -- -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.8 36.472 -- 1.34 -- 55999 2000 99.99 -- 0.1976 0.1963 0.2338 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8 1.845 -- 141 3817 0.3239 0.3851 -- 100.0
X Ray Diffraction 1.845 1.8949 -- 140 3756 0.2914 0.3592 -- 100.0
X Ray Diffraction 1.8949 1.9507 -- 140 3803 0.2693 0.3405 -- 100.0
X Ray Diffraction 1.9507 2.0136 -- 140 3762 0.2464 0.2959 -- 100.0
X Ray Diffraction 2.0136 2.0856 -- 141 3806 0.2277 0.2753 -- 100.0
X Ray Diffraction 2.0856 2.1691 -- 140 3794 0.2255 0.2312 -- 100.0
X Ray Diffraction 2.1691 2.2678 -- 142 3820 0.2191 0.2708 -- 100.0
X Ray Diffraction 2.2678 2.3873 -- 141 3807 0.2206 0.2622 -- 100.0
X Ray Diffraction 2.3873 2.5369 -- 143 3857 0.2204 0.2535 -- 100.0
X Ray Diffraction 2.5369 2.7327 -- 142 3848 0.214 0.2499 -- 100.0
X Ray Diffraction 2.7327 3.0076 -- 143 3865 0.2161 0.2428 -- 100.0
X Ray Diffraction 3.0076 3.4425 -- 146 3913 0.2001 0.2375 -- 100.0
X Ray Diffraction 3.4425 4.336 -- 145 3952 0.1664 0.2079 -- 100.0
X Ray Diffraction 4.336 36.4798 -- 156 4199 0.1551 0.1844 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 0.881
f_chiral_restr 0.057
f_bond_d 0.006
f_dihedral_angle_d 17.841
f_plane_restr 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4198
Nucleic Acid Atoms 0
Heterogen Atoms 70
Solvent Atoms 386

Software

Software
Software Name Purpose
PHENIX refinement version: (1.14_3260: ???)
XPREP data reduction
XDS data scaling
PHASER phasing