X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Evaporation
pH 7
Temperature 291.0
Details PEG 3350, MgCl2, Bis-Tris6.5

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 39.33 α = 90
b = 135.94 β = 95.95
c = 60.05 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2015-10-15
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-G 0.97856 APS 21-ID-G

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.85 30 80.0 0.052 0.044 -- 3.9 -- 42920 -- 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.85 1.88 70.3 0.29 0.34 2.2 2.7 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.85 29.612 -- 1.58 -- 42686 1990 79.97 -- 0.1733 0.1716 0.2068 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.85 1.8963 -- 128 2620 0.2471 0.2964 -- 72.0
X Ray Diffraction 1.8963 1.9475 -- 127 2615 0.2276 0.2829 -- 72.0
X Ray Diffraction 1.9475 2.0048 -- 126 2567 0.2132 0.277 -- 71.0
X Ray Diffraction 2.0048 2.0695 -- 128 2632 0.2021 0.2598 -- 72.0
X Ray Diffraction 2.0695 2.1435 -- 130 2645 0.1868 0.2387 -- 74.0
X Ray Diffraction 2.1435 2.2293 -- 129 2648 0.1765 0.2297 -- 73.0
X Ray Diffraction 2.2293 2.3307 -- 130 2650 0.1669 0.1804 -- 73.0
X Ray Diffraction 2.3307 2.4535 -- 132 2696 0.1735 0.1936 -- 74.0
X Ray Diffraction 2.4535 2.6071 -- 134 2741 0.1852 0.2282 -- 75.0
X Ray Diffraction 2.6071 2.8083 -- 142 2922 0.1919 0.214 -- 81.0
X Ray Diffraction 2.8083 3.0906 -- 157 3186 0.1923 0.2087 -- 88.0
X Ray Diffraction 3.0906 3.5372 -- 173 3539 0.1689 0.2165 -- 97.0
X Ray Diffraction 3.5372 4.4541 -- 175 3587 0.1432 0.1762 -- 99.0
X Ray Diffraction 4.4541 29.6156 -- 179 3648 0.1467 0.1735 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.041
f_plane_restr 0.005
f_dihedral_angle_d 7.419
f_bond_d 0.006
f_angle_d 0.79
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4763
Nucleic Acid Atoms 0
Heterogen Atoms 200
Solvent Atoms 423

Software

Software
Software Name Purpose
PHENIX refinement version: 1.14_3260
HKL-2000 data reduction
HKL-2000 data scaling
PHASER phasing