ELECTRON MICROSCOPY Experimental Data



EM Sample
Sample Vitrification Details Blotted from behind the grid for 2 seconds
Sample Aggregation State HELICAL ARRAY
Sample Reconstruction Method HELICAL
Name of Sample Microtubule-bound Kif7
EM Data Acquisition
Date of Experiment --
Temperature (Kelvin) --
Microscope Model FEI TITAN KRIOS
Detector Type GATAN K2 SUMMIT (4k x 4k)
Minimum Defocus (nm) --
Maximum Defocus (nm) --
Minimum Tilt Angle (degrees) --
Maximum Tilt Angle (degrees) --
Nominal CS --
Imaging Mode BRIGHT FIELD
Electron Dose (electrons per Å**-2) 37.0
Illumination Mode FLOOD BEAM
Nominal Magnification --
Calibrated Magnification --
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details --
3D Reconstruction
Software Package(s) FREALIX
Reconstruction Method(s) --
EM Image Reconstruction Statistics
Number of Particles 37220
Other Details --
Effective Resolution 4.2
EM Map-Model Fitting and Refinement
Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Fitting Software
-- FLEXIBLE FIT -- -- -- --