X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.5
Temperature 293.0
Details 0.45 M ammonium sulfate, 5% PEG3350, 0.1 M Bis-Tris, pH 5.5, cryoprotectant: 25% glycerol

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 71.63 α = 90
b = 71.63 β = 90
c = 122.26 γ = 120
Symmetry
Space Group P 61

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2014-03-07
Diffraction Radiation
Monochromator Protocol
Cryogenically-cooled single crystal Si(220) side bounce SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.97918 APS 24-ID-E

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.27 122 100.0 0.116 -- -- 5.7 -- 16495 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.27 2.39 -- 1.125 -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.27 43.542 -- 1.28 -- 16438 832 99.51 -- 0.1978 0.1954 0.245 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.2701 2.3369 -- 152 2541 0.3113 0.346 -- 100.0
X Ray Diffraction 2.3369 2.4124 -- 151 2567 0.2861 0.3483 -- 100.0
X Ray Diffraction 2.4124 2.4986 -- 152 2532 0.2736 0.3252 -- 99.0
X Ray Diffraction 2.4986 2.5986 -- 128 2575 0.2657 0.2969 -- 100.0
X Ray Diffraction 2.5986 2.7168 -- 132 2580 0.254 0.2801 -- 100.0
X Ray Diffraction 2.7168 2.8601 -- 134 2548 0.236 0.2812 -- 100.0
X Ray Diffraction 2.8601 3.0392 -- 135 2539 0.2176 0.3071 -- 100.0
X Ray Diffraction 3.0392 3.2738 -- 142 2576 0.1977 0.2403 -- 100.0
X Ray Diffraction 3.2738 3.6031 -- 125 2544 0.1707 0.2599 -- 100.0
X Ray Diffraction 3.6031 4.1241 -- 136 2568 0.1559 0.194 -- 100.0
X Ray Diffraction 4.1241 5.1946 -- 123 2541 0.1399 0.1827 -- 99.0
X Ray Diffraction 5.1946 43.5496 -- 127 2553 0.1893 0.2097 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.048
f_dihedral_angle_d 14.293
f_bond_d 0.007
f_angle_d 0.863
f_plane_restr 0.004
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2076
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 112

Software

Software
Software Name Purpose
PHENIX refinement version: (1.13_2998: ???)
XDS data reduction
Aimless data scaling
PHASER phasing