X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 291.0
Details 12.5 MG/ML BRD4, 5MM HEPES PH 7.5, 50MM SODIUM CHLORIDE, 0.5MM DTT, 50MM TRIS PH8.5, 0.1M AMMONIUM, SULFATE, 12.5% PEG 3,350, 10% DMSO, 1 MM HU-10

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 41.83 α = 90
b = 59.51 β = 90
c = 111.42 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 93
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RIGAKU SATURN 944+ mirrors 2016-06-27
Diffraction Radiation
Monochromator Protocol
mirrors SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.54178 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 29.75 97.3 0.033 -- -- 4.643 -- 36520 -- -- 14.68
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.6 1.64 82.9 0.126 -- 6.88 2.719 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.6 29.755 -- 1.46 -- 36514 1826 97.29 -- 0.1613 0.1592 0.2016 Random selection
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.6 1.6433 -- 117 2229 0.2115 0.2837 0.0 83.0
X Ray Diffraction 1.6433 1.6916 -- 130 2472 0.1866 0.2497 0.0 91.0
X Ray Diffraction 1.6916 1.7462 -- 137 2607 0.1875 0.2368 0.0 96.0
X Ray Diffraction 1.7462 1.8086 -- 138 2626 0.1748 0.2401 0.0 98.0
X Ray Diffraction 1.8086 1.881 -- 141 2679 0.1756 0.2292 0.0 99.0
X Ray Diffraction 1.881 1.9666 -- 143 2707 0.1738 0.213 0.0 100.0
X Ray Diffraction 1.9666 2.0703 -- 142 2702 0.1728 0.2107 0.0 99.0
X Ray Diffraction 2.0703 2.1999 -- 144 2725 0.1637 0.2089 0.0 100.0
X Ray Diffraction 2.1999 2.3697 -- 143 2726 0.1587 0.1969 0.0 100.0
X Ray Diffraction 2.3697 2.6081 -- 145 2752 0.1609 0.1901 0.0 100.0
X Ray Diffraction 2.6081 2.9852 -- 145 2765 0.1583 0.2104 0.0 100.0
X Ray Diffraction 2.9852 3.7598 -- 147 2794 0.1447 0.1848 0.0 100.0
X Ray Diffraction 3.7598 29.7601 -- 154 2904 0.1392 0.1731 0.0 99.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 24.7349
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.011
f_chiral_restr 0.049
f_plane_restr 0.008
f_dihedral_angle_d 12.661
f_angle_d 1.259
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2124
Nucleic Acid Atoms 0
Heterogen Atoms 150
Solvent Atoms 289

Software

Software
Software Name Purpose
XDS data reduction
XSCALE data scaling
PHASER phasing
PHENIX refinement version: 1.9_1692
PDB_EXTRACT data extraction version: 3.24