X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.5
Temperature 287.0
Details 1.5M Magnesium sulfate, 0.1M TRIS hydrochloride, pH 8.5

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 74.94 α = 90
b = 74.94 β = 90
c = 185.21 γ = 120
Symmetry
Space Group P 32

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2018-06-11
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U1 0.9791 SSRF BL17U1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 50 97.68 -- 0.185 -- 4.0 -- 76730 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.0 2.03 93.95 -- -- 2.19 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.0 32.45 -- 1.96 -- 76717 2001 97.66 -- 0.154 0.153 0.1905 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.0002 2.0502 -- 127 5011 0.2495 0.2815 -- 93.0
X Ray Diffraction 2.0502 2.1057 -- 143 5346 0.23 0.2559 -- 97.0
X Ray Diffraction 2.1057 2.1676 -- 141 5307 0.2105 0.2782 -- 97.0
X Ray Diffraction 2.1676 2.2375 -- 141 5368 0.1909 0.236 -- 98.0
X Ray Diffraction 2.2375 2.3175 -- 146 5355 0.179 0.2492 -- 98.0
X Ray Diffraction 2.3175 2.4103 -- 138 5377 0.1614 0.2008 -- 98.0
X Ray Diffraction 2.4103 2.5199 -- 150 5165 0.164 0.2176 -- 95.0
X Ray Diffraction 2.5199 2.6527 -- 143 5427 0.156 0.1981 -- 99.0
X Ray Diffraction 2.6527 2.8188 -- 150 5431 0.1521 0.2028 -- 100.0
X Ray Diffraction 2.8188 3.0363 -- 144 5439 0.149 0.1795 -- 100.0
X Ray Diffraction 3.0363 3.3416 -- 144 5450 0.1502 0.2124 -- 100.0
X Ray Diffraction 3.3416 3.8245 -- 147 5345 0.14 0.1473 -- 98.0
X Ray Diffraction 3.8245 4.8159 -- 146 5257 0.1211 0.1678 -- 96.0
X Ray Diffraction 4.8159 32.4538 -- 141 5438 0.1492 0.1757 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.006
f_dihedral_angle_d 15.644
f_angle_d 1.4
f_chiral_restr 0.06
f_bond_d 0.013
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6748
Nucleic Acid Atoms 0
Heterogen Atoms 40
Solvent Atoms 680

Software

Software
Software Name Purpose
PHENIX refinement version: 1.8.4_1496
HKL-2000 data reduction
HKL-2000 data scaling
PHENIX refinement
PHENIX phasing