X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
Temperature 293.0
Details 0.1 M Bis-Tris, pH 6.0, 22% (w/v) PEG 3350, 0.2 M NaCl

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 51.99 α = 90
b = 120.91 β = 90
c = 177.56 γ = 90
Symmetry
Space Group P 2 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS3 S 6M -- 2018-01-30
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08ID-1 0.979490 CLSI 08ID-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 49.9 99.9 -- -- -- 13.2 -- 35359 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.6 2.7 100.0 -- -- 1.6 12.9 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.6 49.899 -- 1.34 -- 35294 1765 99.88 -- 0.2037 0.2018 0.2398 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.6 2.6703 -- 131 2479 0.3187 0.379 -- 100.0
X Ray Diffraction 2.6703 2.7489 -- 135 2569 0.2802 0.3273 -- 100.0
X Ray Diffraction 2.7489 2.8376 -- 132 2502 0.2581 0.2696 -- 100.0
X Ray Diffraction 2.8376 2.939 -- 135 2559 0.2517 0.3294 -- 100.0
X Ray Diffraction 2.939 3.0566 -- 135 2561 0.2477 0.2852 -- 100.0
X Ray Diffraction 3.0566 3.1957 -- 133 2529 0.2144 0.2395 -- 100.0
X Ray Diffraction 3.1957 3.3642 -- 135 2556 0.2088 0.2454 -- 100.0
X Ray Diffraction 3.3642 3.5749 -- 135 2558 0.1967 0.2257 -- 100.0
X Ray Diffraction 3.5749 3.8508 -- 135 2576 0.2017 0.219 -- 100.0
X Ray Diffraction 3.8508 4.2382 -- 136 2595 0.1719 0.2401 -- 100.0
X Ray Diffraction 4.2382 4.851 -- 138 2615 0.1528 0.1836 -- 100.0
X Ray Diffraction 4.851 6.11 -- 140 2647 0.1778 0.2244 -- 100.0
X Ray Diffraction 6.11 49.9079 -- 145 2783 0.1933 0.2201 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.049
f_angle_d 0.76
f_bond_d 0.005
f_plane_restr 0.005
f_dihedral_angle_d 18.991
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 8447
Nucleic Acid Atoms 0
Heterogen Atoms 12
Solvent Atoms 189

Software

Software
Software Name Purpose
PHENIX refinement version: (1.13_2998: ???)
XDS data reduction
XDS data scaling
PHASER phasing