X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 293.0
Details 24% PEG 400, 3% PPE 400, 100mM Bis-Tris pH 7.5, 10mM TCEP

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 39.63 α = 90
b = 106.64 β = 90
c = 156.48 γ = 90
Symmetry
Space Group P 2 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2008-07-01
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.2 1.0 ALS 5.0.2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.25 50 99.0 0.084 -- -- 5.3 -- 61441 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.25 2.3 92.5 0.509 -- 1.9 4.8 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.389 46.856 -- 1.34 -- 26343 1996 96.63 -- 0.2168 0.2126 0.2676 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3886 2.4484 -- 130 1587 0.2887 0.3809 -- 89.0
X Ray Diffraction 2.4484 2.5146 -- 135 1648 0.2694 0.3661 -- 94.0
X Ray Diffraction 2.5146 2.5885 -- 138 1688 0.2447 0.3057 -- 96.0
X Ray Diffraction 2.5885 2.6721 -- 140 1702 0.2303 0.2995 -- 96.0
X Ray Diffraction 2.6721 2.7676 -- 141 1729 0.2319 0.33 -- 97.0
X Ray Diffraction 2.7676 2.8784 -- 141 1724 0.2314 0.3112 -- 97.0
X Ray Diffraction 2.8784 3.0094 -- 143 1743 0.2344 0.3072 -- 97.0
X Ray Diffraction 3.0094 3.168 -- 142 1730 0.2426 0.3215 -- 98.0
X Ray Diffraction 3.168 3.3664 -- 145 1761 0.2313 0.3002 -- 98.0
X Ray Diffraction 3.3664 3.6262 -- 146 1781 0.2199 0.2879 -- 99.0
X Ray Diffraction 3.6262 3.991 -- 146 1785 0.2033 0.2343 -- 99.0
X Ray Diffraction 3.991 4.5681 -- 147 1777 0.1769 0.2332 -- 98.0
X Ray Diffraction 4.5681 5.7536 -- 148 1811 0.1979 0.2577 -- 98.0
X Ray Diffraction 5.7536 46.8646 -- 154 1881 0.2002 0.2182 -- 96.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.01
f_plane_restr 0.007
f_angle_d 1.124
f_dihedral_angle_d 21.781
f_chiral_restr 0.061
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4076
Nucleic Acid Atoms 0
Heterogen Atoms 62
Solvent Atoms 69

Software

Software
Software Name Purpose
PHENIX refinement version: (1.10.1_2155: ???)
HKL-2000 data reduction
HKL-2000 data scaling
PHENIX phasing