X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8.5
Temperature 298.0
Details 25% v/v 2-propanol, 100 mM HEPES pH 7.5, 30% w/v PEG 3350, 50 mM sodium chloride

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 134.72 α = 90
b = 31.02 β = 130.66
c = 101.26 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RAYONIX MX-300 -- 2017-11-04
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.9787 APS 21-ID-F

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 38.41 99.3 0.136 -- -- 5.556 -- 30175 -- -- 23.55
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.8 1.9 98.3 1.39 -- 1.19 5.537 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.1 38.408 -- 1.35 -- 19007 1257 99.66 -- 0.193 0.1904 0.2277 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.1 2.1841 -- 141 1941 0.2996 0.3814 0.0 100.0
X Ray Diffraction 2.1841 2.2835 -- 129 1931 0.267 0.3556 0.0 99.0
X Ray Diffraction 2.2835 2.4039 -- 134 1963 0.2308 0.2533 0.0 99.0
X Ray Diffraction 2.4039 2.5544 -- 139 1951 0.2152 0.2621 0.0 100.0
X Ray Diffraction 2.5544 2.7516 -- 140 1947 0.198 0.2473 0.0 100.0
X Ray Diffraction 2.7516 3.0284 -- 141 1977 0.204 0.2448 0.0 100.0
X Ray Diffraction 3.0284 3.4664 -- 143 1975 0.1759 0.2106 0.0 100.0
X Ray Diffraction 3.4664 4.3663 -- 142 1994 0.1478 0.1908 0.0 100.0
X Ray Diffraction 4.3663 38.4142 -- 148 2071 0.1663 0.1781 0.0 100.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 42.2757
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.043
f_plane_restr 0.003
f_dihedral_angle_d 18.797
f_angle_d 0.556
f_bond_d 0.003
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2035
Nucleic Acid Atoms 0
Heterogen Atoms 36
Solvent Atoms 204

Software

Software
Software Name Purpose
XDS data reduction
XSCALE data scaling
PHENIX refinement version: (1.13rc1_2954)
PDB_EXTRACT data extraction version: 3.24
PHASER phasing