X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 277.0
Details 12-15% PEG3350, 0.1M BIS-TRIS 0.2-0.3M MG ACETATE, 0.1M GdCl3 10% glycerol, 5 mM TCEP

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 59.52 α = 90
b = 152.23 β = 90.48
c = 108.8 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 325 mm CCD mirrors 2017-02-19
Diffraction Radiation
Monochromator Protocol
graphite SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL14-1 1.1271 SSRL BL14-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.95 50 99.9 0.212 0.212 -- 4.1 -- 140506 -- -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.95 2.0 99.9 1.509 1.509 0.4 4.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.95 45.987 -- 0.01 -- 271341 13707 97.45 -- 0.2143 0.2118 0.2618 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.95 1.9722 -- 444 8385 0.3815 0.4248 -- 94.0
X Ray Diffraction 1.9722 1.9954 -- 430 8316 0.3737 0.4256 -- 95.0
X Ray Diffraction 1.9954 2.0197 -- 462 8305 0.3644 0.4228 -- 95.0
X Ray Diffraction 2.0197 2.0453 -- 452 8411 0.3552 0.4023 -- 95.0
X Ray Diffraction 2.0453 2.0722 -- 525 8228 0.3472 0.3826 -- 95.0
X Ray Diffraction 2.0722 2.1006 -- 469 8434 0.3456 0.3965 -- 96.0
X Ray Diffraction 2.1006 2.1306 -- 482 8457 0.3318 0.3617 -- 96.0
X Ray Diffraction 2.1306 2.1624 -- 467 8309 0.3139 0.3495 -- 96.0
X Ray Diffraction 2.1624 2.1962 -- 396 8641 0.3117 0.3656 -- 96.0
X Ray Diffraction 2.1962 2.2322 -- 478 8417 0.2932 0.3386 -- 96.0
X Ray Diffraction 2.2322 2.2707 -- 392 8553 0.2853 0.3391 -- 96.0
X Ray Diffraction 2.2707 2.312 -- 468 8534 0.2774 0.3537 -- 97.0
X Ray Diffraction 2.312 2.3564 -- 455 8477 0.2637 0.2941 -- 97.0
X Ray Diffraction 2.3564 2.4045 -- 446 8560 0.2659 0.3212 -- 97.0
X Ray Diffraction 2.4045 2.4568 -- 476 8614 0.2581 0.3389 -- 97.0
X Ray Diffraction 2.4568 2.5139 -- 481 8554 0.2529 0.3017 -- 98.0
X Ray Diffraction 2.5139 2.5768 -- 425 8703 0.2498 0.2736 -- 98.0
X Ray Diffraction 2.5768 2.6465 -- 496 8508 0.2426 0.3062 -- 98.0
X Ray Diffraction 2.6465 2.7243 -- 497 8687 0.2317 0.2782 -- 98.0
X Ray Diffraction 2.7243 2.8123 -- 423 8670 0.2354 0.2998 -- 98.0
X Ray Diffraction 2.8123 2.9128 -- 513 8600 0.2311 0.2679 -- 99.0
X Ray Diffraction 2.9128 3.0294 -- 380 8832 0.2233 0.3058 -- 99.0
X Ray Diffraction 3.0294 3.1672 -- 426 8847 0.2197 0.2963 -- 99.0
X Ray Diffraction 3.1672 3.3341 -- 480 8740 0.2075 0.2908 -- 100.0
X Ray Diffraction 3.3341 3.543 -- 486 8748 0.186 0.2337 -- 100.0
X Ray Diffraction 3.543 3.8164 -- 450 8803 0.1712 0.2291 -- 100.0
X Ray Diffraction 3.8164 4.2002 -- 487 8817 0.1595 0.2014 -- 100.0
X Ray Diffraction 4.2002 4.8074 -- 433 8839 0.1383 0.1858 -- 100.0
X Ray Diffraction 4.8074 6.0547 -- 479 8814 0.1584 0.2069 -- 100.0
X Ray Diffraction 6.0547 46.0001 -- 409 8831 0.1891 0.2024 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 1.013
f_chiral_restr 0.054
f_plane_restr 0.006
f_bond_d 0.009
f_dihedral_angle_d 14.484
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 12824
Nucleic Acid Atoms 0
Heterogen Atoms 512
Solvent Atoms 392

Software

Software
Software Name Purpose
PHENIX refinement version: (1.11.1-2575_1496: ???)
iMOSFLM data reduction
Aimless data scaling
PHASER phasing