X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Evaporation
Temperature 277.0
Details ammonium sulphate, Na-citrate

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 126.39 α = 90
b = 126.24 β = 90
c = 191.52 γ = 90
Symmetry
Space Group I 2 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 325 mm CCD -- 2014-09-26
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.1 0.99994 ALS 8.2.1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.7 42.31 99.6 -- -- -- 7.1 -- 41173 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.7 2.8 -- -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.7 42.31 -- 1.34 -- 41173 1981 97.01 -- 0.2116 0.2098 0.2459 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.6988 2.7663 -- 144 2474 0.289 0.3194 -- 88.0
X Ray Diffraction 2.7663 2.841 -- 139 2654 0.2574 0.298 -- 93.0
X Ray Diffraction 2.841 2.9246 -- 135 2756 0.2544 0.2533 -- 98.0
X Ray Diffraction 2.9246 3.019 -- 115 2892 0.2416 0.2829 -- 99.0
X Ray Diffraction 3.019 3.1269 -- 140 2832 0.2432 0.2399 -- 99.0
X Ray Diffraction 3.1269 3.252 -- 156 2804 0.2369 0.2869 -- 99.0
X Ray Diffraction 3.252 3.4 -- 159 2804 0.2132 0.2579 -- 99.0
X Ray Diffraction 3.4 3.5791 -- 170 2817 0.2019 0.219 -- 99.0
X Ray Diffraction 3.5791 3.8032 -- 127 2839 0.2188 0.3286 -- 98.0
X Ray Diffraction 3.8032 4.0967 -- 141 2857 0.1829 0.2292 -- 98.0
X Ray Diffraction 4.0967 4.5085 -- 123 2849 0.1838 0.2305 -- 98.0
X Ray Diffraction 4.5085 5.1599 -- 96 2880 0.1713 0.2287 -- 98.0
X Ray Diffraction 5.1599 6.4972 -- 140 2872 0.249 0.2615 -- 97.0
X Ray Diffraction 6.4972 42.3199 -- 196 2862 0.205 0.2231 -- 95.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 1.215
f_chiral_restr 0.05
f_bond_d 0.01
f_dihedral_angle_d 21.02
f_plane_restr 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3605
Nucleic Acid Atoms 0
Heterogen Atoms 449
Solvent Atoms 5

Software

Software
Software Name Purpose
PHENIX refinement version: 1.9_1692
HKL-2000 data reduction
HKL-2000 data scaling
AutoSol phasing