X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6
Temperature 293.0
Details 0.1 M PCTP buffer pH6, 25% (w/v) PEG 1500

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 60.56 α = 90
b = 118.19 β = 90
c = 146.34 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 93.15
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RIGAKU SATURN 944 -- 2016-09-30
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU FR-E DW 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.61 50 98.5 -- 0.102 -- 6.8 -- 32211 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.61 2.7 85.4 -- 1.0 1.7 5.2 2735

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.61 45.09 -- 1.33 -- 31608 1640 96.8 -- 0.238 0.235 0.294 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.6114 2.6883 -- 125 2079 0.3012 0.3638 -- 83.0
X Ray Diffraction 2.6883 2.775 -- 113 2467 0.3099 0.4424 -- 96.0
X Ray Diffraction 2.775 2.8742 -- 119 2491 0.3325 0.4207 -- 97.0
X Ray Diffraction 2.8742 2.9892 -- 130 2361 0.4069 0.4907 -- 94.0
X Ray Diffraction 2.9892 3.1253 -- 118 2468 0.397 0.4799 -- 96.0
X Ray Diffraction 3.1253 3.29 -- 150 2553 0.278 0.361 -- 100.0
X Ray Diffraction 3.29 3.496 -- 156 2547 0.2441 0.3092 -- 100.0
X Ray Diffraction 3.496 3.7658 -- 134 2579 0.2162 0.293 -- 100.0
X Ray Diffraction 3.7658 4.1446 -- 136 2552 0.2 0.2621 -- 99.0
X Ray Diffraction 4.1446 4.7437 -- 142 2519 0.1875 0.2712 -- 97.0
X Ray Diffraction 4.7437 5.9744 -- 162 2601 0.2048 0.2412 -- 100.0
X Ray Diffraction 5.9744 45.0961 -- 155 2751 0.2 0.2133 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.007
f_dihedral_angle_d 8.213
f_plane_restr 0.007
f_chiral_restr 0.052
f_angle_d 0.859
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6165
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 70

Software

Software
Software Name Purpose
PHENIX refinement version: (1.12_2829: ???)
HKL-2000 data reduction
HKL-2000 data scaling
PHASER phasing