X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 295.0
Details 8.5% PEG8000, 15% ethylene glycol, 100mM MES pH 5.6 - 5.8

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 62.93 α = 90
b = 62.93 β = 90
c = 187.57 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RAYONIX MX-300 -- 2016-10-05
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08ID-1 1 CLSI 08ID-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.44 50 99.8 -- -- -- 10.6 -- 25168 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
-- -- -- -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.438 41.083 -- 1.34 -- 25168 1275 81.2 -- 0.1892 0.187 0.231 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.4382 2.5358 -- 37 658 0.2749 0.3173 -- 20.0
X Ray Diffraction 2.5358 2.6512 -- 70 1315 0.2504 0.2947 -- 41.0
X Ray Diffraction 2.6512 2.7909 -- 133 2478 0.2548 0.2861 -- 75.0
X Ray Diffraction 2.7909 2.9657 -- 167 3123 0.2467 0.2966 -- 95.0
X Ray Diffraction 2.9657 3.1946 -- 174 3281 0.2547 0.2983 -- 100.0
X Ray Diffraction 3.1946 3.5159 -- 173 3263 0.2109 0.2649 -- 100.0
X Ray Diffraction 3.5159 4.0243 -- 175 3246 0.1807 0.1987 -- 100.0
X Ray Diffraction 4.0243 5.0687 -- 174 3272 0.1365 0.1766 -- 100.0
X Ray Diffraction 5.0687 41.0884 -- 172 3257 0.1429 0.2051 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 11.991
f_bond_d 0.003
f_plane_restr 0.002
f_chiral_restr 0.026
f_angle_d 0.649
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2109
Nucleic Acid Atoms 0
Heterogen Atoms 63
Solvent Atoms 65

Software

Software
Software Name Purpose
PHENIX refinement version: 1.9_1692
HKL-2000 data reduction
HKL-2000 data scaling
PHENIX phasing