X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion
Temperature 293.0
Details Sitting drop vapor diffusion droplets were assembled with 250 nL of 12 mg/mL CamKII, 0.6 mM inhibitor and 250 nL of reservoir solution 24% peg 3350, 0.2 M ammonium tartrate, 0.1 M arginine.

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 54.25 α = 93.34
b = 67.57 β = 92.93
c = 82.84 γ = 90.11
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS EIGER X 9M -- 2017-02-21
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-D 1.08 APS 21-ID-D

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.91 54.2 87.4 -- -- -- 2.0 -- 80037 -- -- 22.25
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
-- -- -- -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.91 54.18 -- 1.986 -- 78940 1330 86.7 -- 0.191 0.19 0.253 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.91 1.9783 -- 139 7821 0.2306 0.3167 -- 87.0
X Ray Diffraction 1.9783 2.0575 -- 114 7642 0.2148 0.3061 -- 85.0
X Ray Diffraction 2.0575 2.1511 -- 122 6863 0.2068 0.2693 -- 77.0
X Ray Diffraction 2.1511 2.2645 -- 136 7631 0.2086 0.2935 -- 85.0
X Ray Diffraction 2.2645 2.4064 -- 138 8136 0.1987 0.2523 -- 91.0
X Ray Diffraction 2.4064 2.5922 -- 141 8148 0.2045 0.2775 -- 91.0
X Ray Diffraction 2.5922 2.8531 -- 133 8061 0.2037 0.2688 -- 90.0
X Ray Diffraction 2.8531 3.2659 -- 137 7773 0.1935 0.2808 -- 87.0
X Ray Diffraction 3.2659 4.1144 -- 119 7073 0.1671 0.2258 -- 79.0
X Ray Diffraction 4.1144 54.2002 -- 151 8462 0.1722 0.2076 -- 95.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 25.33
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.006
f_chiral_restr 0.05
f_angle_d 0.825
f_dihedral_angle_d 16.965
f_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 9240
Nucleic Acid Atoms 0
Heterogen Atoms 174
Solvent Atoms 936

Software

Software
Software Name Purpose
PHENIX refinement version: 1.12_2829
XDS data reduction
Aimless data scaling
AMoRE phasing