X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.2
Temperature 296.0
Details 8% Tacsimate (pH 7.0), 20% Polyethylene glycol 3,350, 0.1 M HEPES (pH 7.2)

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 147.22 α = 90
b = 80.02 β = 111.47
c = 93.4 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 77
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 6M-F -- 2015-11-11
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.97920 APS 24-ID-C

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.09 69.1 97.6 0.097 -- -- 6.9 -- 58291 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.09 2.165 99.6 0.097 -- 1.1 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.09 69.097 -- 1.36 -- 58275 2000 97.3 -- 0.1938 0.1926 0.2258 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.09 2.1423 -- 141 3990 0.2915 0.3122 -- 97.0
X Ray Diffraction 2.1423 2.2002 -- 144 4020 0.2683 0.2933 -- 98.0
X Ray Diffraction 2.2002 2.265 -- 142 4010 0.263 0.2807 -- 98.0
X Ray Diffraction 2.265 2.3381 -- 143 3997 0.2504 0.246 -- 97.0
X Ray Diffraction 2.3381 2.4217 -- 141 3994 0.2434 0.3035 -- 97.0
X Ray Diffraction 2.4217 2.5186 -- 139 3895 0.2489 0.289 -- 94.0
X Ray Diffraction 2.5186 2.6332 -- 142 3996 0.2329 0.2661 -- 98.0
X Ray Diffraction 2.6332 2.7721 -- 145 4064 0.2341 0.2485 -- 98.0
X Ray Diffraction 2.7721 2.9458 -- 143 4054 0.2185 0.2782 -- 98.0
X Ray Diffraction 2.9458 3.1732 -- 144 4034 0.2106 0.2309 -- 98.0
X Ray Diffraction 3.1732 3.4925 -- 141 3990 0.1866 0.2248 -- 96.0
X Ray Diffraction 3.4925 3.9979 -- 146 4093 0.1727 0.2242 -- 99.0
X Ray Diffraction 3.9979 5.0367 -- 143 4009 0.1495 0.189 -- 97.0
X Ray Diffraction 5.0367 69.1347 -- 146 4129 0.1675 0.183 -- 97.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 0.884
f_chiral_restr 0.048
f_plane_restr 0.006
f_bond_d 0.007
f_dihedral_angle_d 9.176
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3321
Nucleic Acid Atoms 1786
Heterogen Atoms 1
Solvent Atoms 256

Software

Software
Software Name Purpose
PHENIX refinement version: (1.12_2829: ???)
HKL-2000 data reduction
Aimless data scaling
PHENIX phasing