X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7
Temperature 293.15
Details 2.6 M AMMONIUM SULFATE, 0.1 M TRIS-HCL PH 7, 3% ISOPROPANOL, 2% DMSO

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 95.96 α = 90
b = 95.96 β = 90
c = 104.06 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RIGAKU SATURN 944+ -- 2017-07-27
Diffraction Radiation
Monochromator Protocol
DOUBLE MIRRORS SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.54178 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.16 50 95.8 -- 0.077 -- 5.2 -- 28763 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.16 2.2 71.1 -- 0.458 2.3 3.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.163 38.589 -- 1.33 -- 28016 1406 93.18 -- 0.2123 0.2102 0.2535 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.1628 2.24 -- 124 1982 0.2613 0.35 -- 72.0
X Ray Diffraction 2.24 2.3297 -- 123 2509 0.2561 0.3557 -- 88.0
X Ray Diffraction 2.3297 2.4357 -- 184 2700 0.2483 0.3288 -- 97.0
X Ray Diffraction 2.4357 2.5641 -- 152 2744 0.2739 0.3577 -- 97.0
X Ray Diffraction 2.5641 2.7247 -- 146 2718 0.2564 0.311 -- 96.0
X Ray Diffraction 2.7247 2.9351 -- 135 2690 0.2409 0.2901 -- 95.0
X Ray Diffraction 2.9351 3.2303 -- 121 2741 0.2321 0.2842 -- 95.0
X Ray Diffraction 3.2303 3.6974 -- 126 2772 0.1979 0.2451 -- 96.0
X Ray Diffraction 3.6974 4.6571 -- 130 2802 0.1638 0.1826 -- 97.0
X Ray Diffraction 4.6571 38.5951 -- 165 2952 0.184 0.1927 -- 98.0
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 11.601
f_angle_d 0.812
f_chiral_restr 0.059
f_plane_restr 0.005
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2545
Nucleic Acid Atoms 0
Heterogen Atoms 70
Solvent Atoms 144

Software

Software
Software Name Purpose
PHENIX refinement version: 1.11.1_2575
HKL-2000 data reduction
HKL-2000 data scaling
PHASER phasing