X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.1
Temperature 298.0
Details 13% PEG3350, 0.25 M magnesium chloride, 0.1 M Tris

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 228.11 α = 90
b = 49.9 β = 95.72
c = 92.46 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2016-02-23
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.4 50 98.0 0.061 -- -- 3.8 -- 40458 -- -- 23.94
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.4 2.44 98.5 0.533 -- -- 3.7 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.394 38.754 -- 0.0 -- 38731 1919 93.62 -- 0.2033 0.2011 0.2437 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3941 2.454 -- 119 2227 0.2665 0.3063 -- 81.0
X Ray Diffraction 2.454 2.5203 -- 126 2436 0.2565 0.3054 -- 87.0
X Ray Diffraction 2.5203 2.5945 -- 128 2480 0.2429 0.3028 -- 89.0
X Ray Diffraction 2.5945 2.6782 -- 133 2542 0.2385 0.3247 -- 91.0
X Ray Diffraction 2.6782 2.7739 -- 139 2598 0.2242 0.3046 -- 93.0
X Ray Diffraction 2.7739 2.8849 -- 138 2604 0.2196 0.2281 -- 95.0
X Ray Diffraction 2.8849 3.0162 -- 136 2718 0.2177 0.2773 -- 97.0
X Ray Diffraction 3.0162 3.1751 -- 140 2728 0.2204 0.27 -- 98.0
X Ray Diffraction 3.1751 3.3739 -- 143 2740 0.2077 0.2663 -- 98.0
X Ray Diffraction 3.3739 3.6343 -- 137 2604 0.2014 0.2435 -- 93.0
X Ray Diffraction 3.6343 3.9997 -- 140 2685 0.1824 0.1941 -- 95.0
X Ray Diffraction 3.9997 4.5776 -- 145 2804 0.158 0.2223 -- 99.0
X Ray Diffraction 4.5776 5.7643 -- 146 2797 0.1653 0.1948 -- 99.0
X Ray Diffraction 5.7643 38.7592 -- 149 2849 0.1951 0.2118 -- 97.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_dihedral_angle_d 18.246
f_chiral_restr 0.049
f_bond_d 0.002
f_angle_d 0.575
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6484
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 212

Software

Software
Software Name Purpose
PHENIX refinement version: (1.10.1_2155: ???)
HKL-2000 data scaling
HKL-2000 data collection
PDB_EXTRACT data extraction version: 3.22
HKL-2000 data reduction
PHASER phasing