X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
Temperature 289.15
Details 4M sodium formate, 15% glycerol

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 32.87 α = 90
b = 47.8 β = 90
c = 79.45 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS3 6M -- 2017-12-27
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NFPSS BEAMLINE BL19U1 0.978 NFPSS BL19U1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.7 40.96 98.0 -- -- -- 6.2 -- 14140 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.701 1.762 -- -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.701 40.957 -- 1.35 -- 14131 697 98.49 -- 0.186 0.1847 0.2111 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.701 1.8324 -- 124 2513 0.2208 0.2748 -- 94.0
X Ray Diffraction 1.8324 2.0168 -- 135 2662 0.1882 0.2476 -- 100.0
X Ray Diffraction 2.0168 2.3086 -- 141 2694 0.1812 0.2233 -- 100.0
X Ray Diffraction 2.3086 2.9085 -- 149 2714 0.1894 0.2281 -- 100.0
X Ray Diffraction 2.9085 40.9685 -- 148 2851 0.178 0.1845 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.045
f_bond_d 0.007
f_plane_restr 0.005
f_angle_d 1.027
f_dihedral_angle_d 12.163
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1047
Nucleic Acid Atoms 0
Heterogen Atoms 29
Solvent Atoms 80

Software

Software
Software Name Purpose
PHENIX refinement version: (1.10.1_2155: ???)
XDS data reduction
Aimless data scaling
PHENIX phasing