X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
Temperature 293.0
Details Ammonium sulfate, PEG 3350, Bis-Tris

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 38.65 α = 113.5
b = 79.89 β = 92.82
c = 85.76 γ = 102.84
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RAYONIX MX300HE -- 2016-08-04
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSRRC BEAMLINE BL15A1 1.00 NSRRC BL15A1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.76 30 95.8 -- -- -- 1.3 -- 230256 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
-- -- -- -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.76 25.438 -- 0.09 -- 83118 1426 92.58 -- 0.1735 0.173 0.1994 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.76 1.8229 -- 130 7136 0.2474 0.2933 -- 81.0
X Ray Diffraction 1.8229 1.8959 -- 131 7535 0.2187 0.259 -- 86.0
X Ray Diffraction 1.8959 1.9821 -- 139 7873 0.1965 0.2607 -- 90.0
X Ray Diffraction 1.9821 2.0866 -- 137 8107 0.1874 0.213 -- 91.0
X Ray Diffraction 2.0866 2.2172 -- 138 8280 0.1823 0.2205 -- 94.0
X Ray Diffraction 2.2172 2.3883 -- 156 8320 0.1835 0.2124 -- 94.0
X Ray Diffraction 2.3883 2.6284 -- 154 8454 0.1838 0.2189 -- 96.0
X Ray Diffraction 2.6284 3.0082 -- 143 8598 0.1763 0.2048 -- 97.0
X Ray Diffraction 3.0082 3.7881 -- 149 8682 0.152 0.1639 -- 98.0
X Ray Diffraction 3.7881 25.4406 -- 149 8707 0.1491 0.1655 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_dihedral_angle_d 12.595
f_bond_d 0.004
f_chiral_restr 0.03
f_angle_d 0.812
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6552
Nucleic Acid Atoms 0
Heterogen Atoms 78
Solvent Atoms 1260

Software

Software
Software Name Purpose
PHENIX refinement version: dev_1839
XDS data reduction
XDS data scaling
PHASER phasing