X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 293.0
Details 0.1M Bis-Tris 5.0, 22.5% PEG 3350, 5mM TCEP

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 155.76 α = 90
b = 72.45 β = 113.41
c = 76.16 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH -- 2011-08-06
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE BRUKER AXS MICROSTAR 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.05 100 98.7 -- -- -- 2.7 -- 48272 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
-- -- -- -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.05 37.891 -- 0.0 -- 48202 984 98.48 -- 0.1753 0.1747 0.2018 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.0501 2.1581 -- 140 6617 0.2397 0.2671 -- 97.0
X Ray Diffraction 2.1581 2.2933 -- 142 6505 0.2191 0.248 -- 96.0
X Ray Diffraction 2.2933 2.4704 -- 140 6736 0.1985 0.228 -- 99.0
X Ray Diffraction 2.4704 2.7189 -- 136 6807 0.1864 0.2179 -- 100.0
X Ray Diffraction 2.7189 3.1122 -- 146 6819 0.1769 0.1994 -- 100.0
X Ray Diffraction 3.1122 3.9204 -- 131 6839 0.1577 0.2049 -- 99.0
X Ray Diffraction 3.9204 37.8977 -- 149 6895 0.1528 0.1639 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 18.354
f_plane_restr 0.009
f_chiral_restr 0.119
f_bond_d 0.017
f_angle_d 1.594
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4864
Nucleic Acid Atoms 0
Heterogen Atoms 111
Solvent Atoms 526

Software

Software
Software Name Purpose
PHENIX refinement version: 1.8.4_1496
HKL-3000 data reduction
HKL-3000 data scaling
PHASER phasing