X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 290.0
Details 1.2 - 1.5 M Ammonium sulfate, 0.1 M Bis-Tris pH = 6.0 - 6.5

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 160.85 α = 90
b = 68.31 β = 117.68
c = 77.41 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 Cryogenically-cooled single crystal Si(220) side bounce monochromator 2014-11-26
Diffraction Radiation
Monochromator Protocol
Cryogenically-cooled single crystal Si(220) side bounce monochromator SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.97918 APS 24-ID-E

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 71.22 99.56 0.1519 -- -- 3.8 -- 25927 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.5 2.589 99.69 1.05 -- 1.27 3.8 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.5 71.218 -- 1.35 -- 25815 2015 99.56 -- 0.234 0.2297 0.2841 Random selection
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.5 2.5626 -- 146 1683 0.3381 0.3924 -- 100.0
X Ray Diffraction 2.5626 2.6318 -- 142 1700 0.3087 0.3816 -- 100.0
X Ray Diffraction 2.6318 2.7093 -- 133 1665 0.3109 0.3974 -- 99.0
X Ray Diffraction 2.7093 2.7967 -- 140 1666 0.2993 0.3599 -- 99.0
X Ray Diffraction 2.7967 2.8967 -- 141 1696 0.2965 0.3963 -- 99.0
X Ray Diffraction 2.8967 3.0127 -- 147 1681 0.2911 0.3477 -- 99.0
X Ray Diffraction 3.0127 3.1498 -- 148 1698 0.2705 0.3278 -- 100.0
X Ray Diffraction 3.1498 3.3159 -- 139 1689 0.2431 0.3129 -- 100.0
X Ray Diffraction 3.3159 3.5236 -- 144 1717 0.2375 0.3086 -- 100.0
X Ray Diffraction 3.5236 3.7957 -- 143 1697 0.2134 0.2413 -- 100.0
X Ray Diffraction 3.7957 4.1776 -- 147 1705 0.1886 0.2295 -- 100.0
X Ray Diffraction 4.1776 4.782 -- 142 1709 0.1642 0.1937 -- 100.0
X Ray Diffraction 4.782 6.0243 -- 150 1729 0.1927 0.2511 -- 100.0
X Ray Diffraction 6.0243 71.2467 -- 153 1765 0.2252 0.2901 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 52.8
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.007
f_chiral_restr 0.062
f_angle_d 1.066
f_bond_d 0.008
f_dihedral_angle_d 14.857
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4359
Nucleic Acid Atoms 0
Heterogen Atoms 27
Solvent Atoms 31

Software

Software
Software Name Purpose
PHENIX refinement version: (1.12_2829: ???)
XDS data reduction
XDS data scaling
PHASER phasing