X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7
Temperature 277.0
Details 0.1 M HEPES, 1.6 M ammonium sulfate

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 131.73 α = 90
b = 131.73 β = 90
c = 418.72 γ = 90
Symmetry
Space Group I 41 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2015-11-14
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.97918 APS 24-ID-E

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.2 125.66 98.2 -- 0.244 -- 5.0 -- 30172 -- -- 60.8
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.2 3.37 99.4 -- 1.03 1.9 5.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.2 95.8 -- 1.35 -- 30163 1998 97.29 -- 0.1974 0.1948 0.2344 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.2 3.2801 -- 143 2019 0.3048 0.3942 -- 99.0
X Ray Diffraction 3.2801 3.3688 -- 141 1984 0.2794 0.3068 -- 99.0
X Ray Diffraction 3.3688 3.4679 -- 144 2029 0.2735 0.3233 -- 99.0
X Ray Diffraction 3.4679 3.5798 -- 141 1998 0.2507 0.2786 -- 99.0
X Ray Diffraction 3.5798 3.7078 -- 142 1992 0.2128 0.2692 -- 99.0
X Ray Diffraction 3.7078 3.8562 -- 141 2008 0.2008 0.2678 -- 98.0
X Ray Diffraction 3.8562 4.0317 -- 143 2012 0.1806 0.2408 -- 98.0
X Ray Diffraction 4.0317 4.2443 -- 143 2007 0.1723 0.1998 -- 98.0
X Ray Diffraction 4.2443 4.5102 -- 141 1992 0.1629 0.1781 -- 98.0
X Ray Diffraction 4.5102 4.8584 -- 143 2007 0.1572 0.1892 -- 97.0
X Ray Diffraction 4.8584 5.3473 -- 143 2011 0.1553 0.1998 -- 97.0
X Ray Diffraction 5.3473 6.121 -- 141 2000 0.1782 0.2254 -- 96.0
X Ray Diffraction 6.121 7.7113 -- 144 2021 0.1842 0.2399 -- 95.0
X Ray Diffraction 7.7113 95.842 -- 148 2085 0.181 0.1989 -- 93.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.011
f_dihedral_angle_d 15.563
f_angle_d 1.347
f_plane_restr 0.01
f_chiral_restr 0.071
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6588
Nucleic Acid Atoms 0
Heterogen Atoms 245
Solvent Atoms 0

Software

Software
Software Name Purpose
PHENIX refinement version: (1.10_2155: ???)
XDS data reduction
XDS data scaling
PHASER phasing