X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8.5
Temperature 295.0
Details 0.2 M lithium sulfate 0.1 M Tris:HCl pH 8.5, 30% polyethylene glycol 4000

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 140.07 α = 90
b = 140.07 β = 90
c = 46.86 γ = 120
Symmetry
Space Group H 3

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2015-11-14
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.97918 APS 24-ID-E

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.62 32.77 99.7 -- 0.069 -- 3.1 -- 43442 -- -- 16.1
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.62 1.71 99.9 -- 0.646 2.0 3.1 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.62 32.77 -- 1.97 -- 43436 2002 99.7 -- 0.1311 0.1288 0.1779 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.6203 1.6608 -- 141 2954 0.1998 0.2678 -- 100.0
X Ray Diffraction 1.6608 1.7057 -- 145 2977 0.1712 0.2499 -- 100.0
X Ray Diffraction 1.7057 1.7559 -- 145 2978 0.1571 0.2338 -- 100.0
X Ray Diffraction 1.7559 1.8125 -- 144 2955 0.1348 0.2146 -- 100.0
X Ray Diffraction 1.8125 1.8773 -- 145 2966 0.1249 0.1869 -- 100.0
X Ray Diffraction 1.8773 1.9525 -- 142 2957 0.1179 0.1849 -- 100.0
X Ray Diffraction 1.9525 2.0413 -- 145 2973 0.1116 0.1701 -- 100.0
X Ray Diffraction 2.0413 2.1489 -- 140 2939 0.11 0.1636 -- 100.0
X Ray Diffraction 2.1489 2.2835 -- 145 2978 0.1132 0.1614 -- 100.0
X Ray Diffraction 2.2835 2.4598 -- 146 2952 0.1201 0.172 -- 100.0
X Ray Diffraction 2.4598 2.7072 -- 139 2974 0.1354 0.1961 -- 100.0
X Ray Diffraction 2.7072 3.0987 -- 145 2953 0.1423 0.2144 -- 100.0
X Ray Diffraction 3.0987 3.903 -- 140 2965 0.1292 0.1636 -- 100.0
X Ray Diffraction 3.903 32.7787 -- 140 2913 0.1213 0.138 -- 98.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 0.987
f_dihedral_angle_d 14.391
f_bond_d 0.01
f_chiral_restr 0.053
f_plane_restr 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2530
Nucleic Acid Atoms 0
Heterogen Atoms 78
Solvent Atoms 354

Software

Software
Software Name Purpose
PHENIX refinement version: (1.10_2155: ???)
XDS data reduction
XDS data scaling
PHASER phasing