X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.2
Temperature 293.0
Details 50 MM TRIS, PH 7.2, 50 MM NACL, 20% PEG 3350, VAPOR DIFFUSION, HANGING DROP, TEMPERATURE 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 52.85 α = 90
b = 104.65 β = 90
c = 116.88 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV++ -- 2014-09-30
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.77 33.43 99.3 0.075 -- -- 4.5 -- 63311 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.77 1.82 91.1 0.76 -- 1.88 3.2 4259

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.77 33.43 -- 1.35 -- 63311 3166 99.3 -- 0.158 0.157 0.185 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.7721 1.7985 -- 116 2209 0.281 0.2971 -- 85.0
X Ray Diffraction 1.7985 1.8266 -- 137 2594 0.2442 0.3029 -- 99.0
X Ray Diffraction 1.8266 1.8566 -- 137 2606 0.216 0.2368 -- 100.0
X Ray Diffraction 1.8566 1.8886 -- 138 2613 0.191 0.2255 -- 100.0
X Ray Diffraction 1.8886 1.9229 -- 134 2554 0.1873 0.2529 -- 100.0
X Ray Diffraction 1.9229 1.9599 -- 138 2625 0.1719 0.2305 -- 100.0
X Ray Diffraction 1.9599 1.9999 -- 136 2577 0.1678 0.1703 -- 100.0
X Ray Diffraction 1.9999 2.0434 -- 138 2625 0.1626 0.2273 -- 100.0
X Ray Diffraction 2.0434 2.0909 -- 137 2601 0.1668 0.2212 -- 100.0
X Ray Diffraction 2.0909 2.1432 -- 137 2600 0.1562 0.1931 -- 100.0
X Ray Diffraction 2.1432 2.2011 -- 138 2621 0.1518 0.1818 -- 100.0
X Ray Diffraction 2.2011 2.2659 -- 136 2583 0.1543 0.2063 -- 100.0
X Ray Diffraction 2.2659 2.339 -- 138 2633 0.1519 0.2028 -- 100.0
X Ray Diffraction 2.339 2.4226 -- 138 2627 0.1516 0.1648 -- 100.0
X Ray Diffraction 2.4226 2.5196 -- 139 2631 0.1589 0.1729 -- 100.0
X Ray Diffraction 2.5196 2.6342 -- 138 2620 0.1554 0.1943 -- 100.0
X Ray Diffraction 2.6342 2.773 -- 138 2636 0.1568 0.2207 -- 100.0
X Ray Diffraction 2.773 2.9466 -- 139 2642 0.1544 0.1876 -- 100.0
X Ray Diffraction 2.9466 3.174 -- 140 2655 0.1584 0.1795 -- 100.0
X Ray Diffraction 3.174 3.4931 -- 140 2660 0.1457 0.1514 -- 100.0
X Ray Diffraction 3.4931 3.9978 -- 141 2676 0.1353 0.1388 -- 100.0
X Ray Diffraction 3.9978 5.0341 -- 143 2715 0.1219 0.1458 -- 100.0
X Ray Diffraction 5.0341 33.4323 -- 150 2842 0.1662 0.1857 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 12.869
f_chiral_restr 0.046
f_bond_d 0.007
f_angle_d 1.048
f_plane_restr 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4212
Nucleic Acid Atoms 0
Heterogen Atoms 8
Solvent Atoms 803

Software

Software
Software Name Purpose
XDS data reduction
XSCALE data scaling
MOLREP phasing
PHENIX refinement version: dev_1839