X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.6
Temperature 293.0
Details Tris-HCl Formate NaCl PEG3350

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 112.12 α = 90
b = 112.12 β = 90
c = 299.18 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RAYONIX MX-300 -- 2016-07-28
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08ID-1 0.97949322 CLSI 08ID-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.4 48.55 77.0 -- 0.21 -- 8.8 -- 23642 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.401 3.52 12.0 0.94 -- 2.78 10.3 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.4011 48.549 -- 1.33 -- 23614 1153 76.65 -- 0.2741 0.2732 0.2896 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.4011 3.5559 -- 25 505 0.4089 0.3114 -- 14.0
X Ray Diffraction 3.5559 3.7433 -- 47 1141 0.3881 0.3663 -- 31.0
X Ray Diffraction 3.7433 3.9777 -- 109 2323 0.3813 0.3611 -- 65.0
X Ray Diffraction 3.9777 4.2847 -- 190 3621 0.3211 0.3184 -- 100.0
X Ray Diffraction 4.2847 4.7155 -- 193 3620 0.2715 0.3245 -- 100.0
X Ray Diffraction 4.7155 5.3971 -- 191 3693 0.2654 0.2668 -- 100.0
X Ray Diffraction 5.3971 6.7968 -- 196 3675 0.283 0.2962 -- 100.0
X Ray Diffraction 6.7968 48.5543 -- 202 3883 0.206 0.2408 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.008
f_angle_d 1.452
f_bond_d 0.017
f_dihedral_angle_d 13.706
f_chiral_restr 0.063
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 8294
Nucleic Acid Atoms 0
Heterogen Atoms 62
Solvent Atoms 1

Software

Software
Software Name Purpose
PHENIX refinement version: (1.10_2155: ???)
XDS data reduction
XDS data scaling
PHENIX phasing