X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7
Temperature 289.0
Details 0.1 M Bis-Tris propane:NaOH, pH 7, 0.6 M K/Na tartrate, cryo 25% glycerol

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 90.18 α = 90
b = 66.91 β = 101.41
c = 90.64 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 210r mirrors 2011-03-05
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 0.97929 APS 19-BM

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 30 100.0 0.096 -- -- 11.3 -- 35690 -- -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.0 2.03 100.0 0.96 -- 2.75 11.3 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.001 28.628 -- 1.35 -- 35618 1815 99.54 -- 0.163 0.1609 0.2049 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.0013 2.0554 -- 138 2423 0.2227 0.311 -- 94.0
X Ray Diffraction 2.0554 2.1158 -- 158 2576 0.2101 0.2799 -- 100.0
X Ray Diffraction 2.1158 2.1841 -- 138 2603 0.1942 0.2618 -- 100.0
X Ray Diffraction 2.1841 2.2621 -- 144 2597 0.1744 0.2102 -- 100.0
X Ray Diffraction 2.2621 2.3527 -- 115 2626 0.1739 0.2368 -- 100.0
X Ray Diffraction 2.3527 2.4597 -- 144 2593 0.1643 0.2137 -- 100.0
X Ray Diffraction 2.4597 2.5893 -- 143 2613 0.1652 0.2153 -- 100.0
X Ray Diffraction 2.5893 2.7514 -- 161 2578 0.1684 0.2261 -- 100.0
X Ray Diffraction 2.7514 2.9636 -- 130 2623 0.1694 0.2173 -- 100.0
X Ray Diffraction 2.9636 3.2615 -- 129 2613 0.1556 0.2136 -- 100.0
X Ray Diffraction 3.2615 3.7326 -- 148 2623 0.145 0.1872 -- 100.0
X Ray Diffraction 3.7326 4.6993 -- 128 2653 0.1388 0.159 -- 100.0
X Ray Diffraction 4.6993 28.6314 -- 139 2682 0.153 0.1739 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 20.938
f_plane_restr 0.007
f_chiral_restr 0.065
f_angle_d 0.94
f_bond_d 0.01
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3337
Nucleic Acid Atoms 0
Heterogen Atoms 34
Solvent Atoms 226

Software

Software
Software Name Purpose
PHENIX refinement version: (dev_2386)
HKL-3000 data reduction
HKL-3000 data scaling
HKL-3000 phasing