X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 293.0
Details 1.2 M tri-sodium citrate, 0.1 M HEPES pH 7.5, 4% MPD

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 39.32 α = 90
b = 39.32 β = 90
c = 147.57 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 6M Mirror: Rh coated flat, toroidal focusing 2016-06-14
Diffraction Radiation
Monochromator Protocol
Si(111) and Si(220) double crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-2 0.97946 SSRL BL9-2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.2 38.22 99.8 0.056 -- -- 12.2 -- 38068 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.2 1.22 97.5 0.636 -- 3.8 10.3 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.193 37.996 -- 1.28 -- 70050 5792 99.63 -- 0.1489 0.1473 0.1669 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.1933 1.2069 -- 217 2042 0.1919 0.2437 -- 97.0
X Ray Diffraction 1.2069 1.2211 -- 182 2172 0.2703 0.3054 -- 100.0
X Ray Diffraction 1.2211 1.236 -- 182 2164 0.1673 0.1821 -- 100.0
X Ray Diffraction 1.236 1.2516 -- 217 2100 0.1329 0.1587 -- 100.0
X Ray Diffraction 1.2516 1.2681 -- 183 2207 0.1366 0.1704 -- 100.0
X Ray Diffraction 1.2681 1.2855 -- 187 2101 0.1665 0.182 -- 100.0
X Ray Diffraction 1.2855 1.3038 -- 214 2132 0.2411 0.3174 -- 99.0
X Ray Diffraction 1.3038 1.3233 -- 196 2133 0.1276 0.1697 -- 100.0
X Ray Diffraction 1.3233 1.344 -- 185 2123 0.131 0.1569 -- 100.0
X Ray Diffraction 1.344 1.366 -- 201 2162 0.1283 0.1497 -- 100.0
X Ray Diffraction 1.366 1.3896 -- 204 2146 0.1191 0.1597 -- 100.0
X Ray Diffraction 1.3896 1.4148 -- 187 2137 0.1185 0.1564 -- 100.0
X Ray Diffraction 1.4148 1.442 -- 199 2167 0.1165 0.1494 -- 100.0
X Ray Diffraction 1.442 1.4715 -- 194 2135 0.1252 0.1506 -- 100.0
X Ray Diffraction 1.4715 1.5035 -- 197 2174 0.1072 0.1354 -- 100.0
X Ray Diffraction 1.5035 1.5384 -- 188 2123 0.1078 0.1647 -- 100.0
X Ray Diffraction 1.5384 1.5769 -- 194 2184 0.1056 0.1134 -- 99.0
X Ray Diffraction 1.5769 1.6196 -- 190 2097 0.1002 0.1512 -- 100.0
X Ray Diffraction 1.6196 1.6672 -- 192 2147 0.1049 0.1297 -- 100.0
X Ray Diffraction 1.6672 1.721 -- 189 2187 0.1015 0.1601 -- 100.0
X Ray Diffraction 1.721 1.7825 -- 197 2152 0.1104 0.1108 -- 100.0
X Ray Diffraction 1.7825 1.8539 -- 191 2144 0.12 0.1375 -- 100.0
X Ray Diffraction 1.8539 1.9383 -- 178 2080 0.1743 0.1688 -- 97.0
X Ray Diffraction 1.9383 2.0405 -- 187 2154 0.1269 0.1395 -- 100.0
X Ray Diffraction 2.0405 2.1683 -- 184 2164 0.134 0.1504 -- 100.0
X Ray Diffraction 2.1683 2.3357 -- 186 2131 0.1802 0.1996 -- 99.0
X Ray Diffraction 2.3357 2.5707 -- 196 2139 0.1544 0.1744 -- 100.0
X Ray Diffraction 2.5707 2.9425 -- 189 2159 0.1656 0.1708 -- 100.0
X Ray Diffraction 2.9425 3.7068 -- 191 2158 0.1603 0.1743 -- 100.0
X Ray Diffraction 3.7068 38.015 -- 195 2144 0.1722 0.1827 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 1.122
f_bond_d 0.009
f_dihedral_angle_d 13.988
f_plane_restr 0.006
f_chiral_restr 0.088
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 989
Nucleic Acid Atoms 0
Heterogen Atoms 12
Solvent Atoms 172

Software

Software
Software Name Purpose
PHENIX refinement version: (1.10_2155: ???)
XDS data reduction
Aimless data scaling
PHASER phasing