X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
Temperature 291.0
Details 0.1 M BIS-TRIS pH 5.5, 0.2 M NaCl and 25% PEG 3350

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 59.19 α = 90
b = 69.35 β = 91.85
c = 106.94 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 2M-F -- 2017-02-26
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1 SLS X06DA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.45 39.03 89.07 -- -- -- 6.7 -- 138568 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.45 1.502 84.6 -- -- 1.05 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.45 39.034 -- 1.33 -- 136349 2007 89.08 -- 0.1725 0.1722 0.1969 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.4499 1.4862 -- 121 8400 0.4974 0.515 -- 79.0
X Ray Diffraction 1.4862 1.5263 -- 172 10685 0.3024 0.2933 -- 100.0
X Ray Diffraction 1.5263 1.5713 -- 152 10760 0.242 0.2551 -- 100.0
X Ray Diffraction 1.5713 1.622 -- 158 10676 0.2273 0.2695 -- 100.0
X Ray Diffraction 1.622 1.68 -- 161 10747 0.2075 0.2369 -- 100.0
X Ray Diffraction 1.68 1.7472 -- 161 10783 0.2028 0.2272 -- 100.0
X Ray Diffraction 1.7472 1.8267 -- 159 10717 0.1786 0.2248 -- 100.0
X Ray Diffraction 1.8267 1.923 -- 109 7233 0.1825 0.2364 -- 99.0
X Ray Diffraction 1.923 2.0435 -- 76 5247 0.1617 0.1846 -- 99.0
X Ray Diffraction 2.0435 2.2013 -- 168 10723 0.16 0.1933 -- 100.0
X Ray Diffraction 2.2013 2.4228 -- 106 7383 0.1588 0.1934 -- 69.0
X Ray Diffraction 2.4228 2.7733 -- 159 10850 0.1518 0.1788 -- 100.0
X Ray Diffraction 2.7733 3.4937 -- 151 10129 0.1465 0.1673 -- 94.0
X Ray Diffraction 3.4937 39.0477 -- 154 10009 0.1385 0.1555 -- 91.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.07
f_bond_d 0.005
f_plane_restr 0.004
f_angle_d 0.76
f_dihedral_angle_d 18.692
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6802
Nucleic Acid Atoms 0
Heterogen Atoms 137
Solvent Atoms 881

Software

Software
Software Name Purpose
PHENIX refinement version: (1.11.1_2575: ???)
XDS data reduction
XSCALE data scaling
PHASER phasing