X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 293.0
Details 2.2M Ammoniumsulfate 0.1 M Sodium citrate

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 71.67 α = 90
b = 87.83 β = 90
c = 122.43 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS3 2M -- 2016-11-02
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE MASSIF-1 0.9660 ESRF MASSIF-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.7 50 98.8 -- -- -- 9.9 -- 42319 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.7 1.74 97.8 -- -- 2.25 4.5 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.7 43.915 -- 1.35 -- 42286 2014 98.74 -- 0.1741 0.1731 0.1962 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.7 1.7425 -- 147 2785 0.3714 0.3875 -- 98.0
X Ray Diffraction 1.7425 1.7896 -- 129 2891 0.3096 0.3414 -- 99.0
X Ray Diffraction 1.7896 1.8423 -- 152 2837 0.2632 0.3003 -- 99.0
X Ray Diffraction 1.8423 1.9017 -- 143 2732 0.273 0.3196 -- 95.0
X Ray Diffraction 1.9017 1.9697 -- 116 2758 0.2836 0.3301 -- 95.0
X Ray Diffraction 1.9697 2.0486 -- 152 2859 0.2008 0.2156 -- 99.0
X Ray Diffraction 2.0486 2.1418 -- 155 2847 0.2061 0.2109 -- 99.0
X Ray Diffraction 2.1418 2.2547 -- 148 2877 0.1911 0.2324 -- 99.0
X Ray Diffraction 2.2547 2.396 -- 134 2886 0.1709 0.1904 -- 99.0
X Ray Diffraction 2.396 2.5809 -- 177 2894 0.1688 0.1915 -- 100.0
X Ray Diffraction 2.5809 2.8406 -- 145 2910 0.1689 0.2052 -- 100.0
X Ray Diffraction 2.8406 3.2516 -- 129 2943 0.165 0.1925 -- 100.0
X Ray Diffraction 3.2516 4.0961 -- 135 2979 0.1432 0.1563 -- 100.0
X Ray Diffraction 4.0961 43.9296 -- 152 3074 0.1513 0.1677 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_dihedral_angle_d 11.66
f_chiral_restr 0.055
f_bond_d 0.006
f_angle_d 0.763
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2568
Nucleic Acid Atoms 45
Heterogen Atoms 44
Solvent Atoms 249

Software

Software
Software Name Purpose
PHENIX refinement version: (1.11.1_2575: ???)
XDS data reduction
XSCALE data scaling
PHASER phasing