X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 277.15
Details 33% (w/v) PEG 6000, Hepes pH 7.5 or 3) 0.2M Zinc acetate, or 0.1 M Sodium cacodylate pH 6.5

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 67.22 α = 90
b = 72.75 β = 90
c = 125.22 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 6M -- 2016-07-20
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 1.1 SOLEIL PROXIMA 1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.38 45.93 93.76 0.1431 -- -- 4.7 -- 119443 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.379 1.428 92.1 -- -- 0.4 4.1 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.3785 45.93 -- 1.33 -- 118923 1987 93.67 -- 0.1836 0.1831 0.213 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.3785 1.413 -- 132 7912 -- 0.3622 -- 90.0
X Ray Diffraction 1.413 1.4512 -- 140 8465 0.306 0.3186 -- 96.0
X Ray Diffraction 1.4512 1.4939 -- 152 8516 0.2814 0.306 -- 96.0
X Ray Diffraction 1.4939 1.5422 -- 157 8514 0.2472 0.2725 -- 97.0
X Ray Diffraction 1.5422 1.5973 -- 129 8566 0.2217 0.2556 -- 97.0
X Ray Diffraction 1.5973 1.6612 -- 154 8492 0.206 0.2322 -- 96.0
X Ray Diffraction 1.6612 1.7368 -- 133 8507 0.1948 0.2148 -- 96.0
X Ray Diffraction 1.7368 1.8284 -- 149 8427 0.1912 0.1901 -- 95.0
X Ray Diffraction 1.8284 1.943 -- 141 8420 0.2039 0.2338 -- 95.0
X Ray Diffraction 1.943 2.093 -- 149 8399 0.1775 0.217 -- 94.0
X Ray Diffraction 2.093 2.3036 -- 141 8251 0.1746 0.2157 -- 92.0
X Ray Diffraction 2.3036 2.6369 -- 141 8278 0.1725 0.194 -- 92.0
X Ray Diffraction 2.6369 3.3221 -- 136 8137 0.1754 0.2169 -- 90.0
X Ray Diffraction 3.3221 45.93 -- 133 8052 0.1472 0.1721 -- 86.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_bond_d 0.005
f_dihedral_angle_d 4.195
f_chiral_restr 0.072
f_angle_d 0.768
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4479
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 848

Software

Software
Software Name Purpose
PHENIX refinement version: (1.11.1_2575: ???)
XDS data reduction
XDS data scaling
PHENIX phasing