X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8.5
Temperature 291.0
Details 37.5% MPD/PEG1000/PEG3350 (MD), 0.175 M Amino Acids Mix (MD), 0.1 M Buffer System 3 (MD) pH8.5

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 32.32 α = 90
b = 104.84 β = 94.53
c = 39.26 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 2M-F -- 2015-02-07
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 0.97795 SLS X06DA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 39.14 97.7 -- -- -- 6.95 -- 33701 -- -- 25.9
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.6 1.69 95.1 -- -- 1.82 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.597 39.136 -- 1.38 -- 33701 1685 97.67 -- 0.165 0.1635 0.1938 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.5969 1.6438 -- 134 2563 0.2544 0.2832 -- 94.0
X Ray Diffraction 1.6438 1.6969 -- 140 2656 0.231 0.2814 -- 97.0
X Ray Diffraction 1.6969 1.7576 -- 137 2595 0.2136 0.2566 -- 97.0
X Ray Diffraction 1.7576 1.8279 -- 140 2665 0.1984 0.2032 -- 97.0
X Ray Diffraction 1.8279 1.9111 -- 139 2648 0.1827 0.2358 -- 97.0
X Ray Diffraction 1.9111 2.0119 -- 141 2662 0.1637 0.2345 -- 97.0
X Ray Diffraction 2.0119 2.1379 -- 140 2677 0.1568 0.191 -- 98.0
X Ray Diffraction 2.1379 2.303 -- 142 2700 0.1575 0.1875 -- 98.0
X Ray Diffraction 2.303 2.5347 -- 140 2654 0.1585 0.2012 -- 99.0
X Ray Diffraction 2.5347 2.9013 -- 143 2721 0.1592 0.1885 -- 99.0
X Ray Diffraction 2.9013 3.655 -- 143 2712 0.1456 0.1757 -- 99.0
X Ray Diffraction 3.655 39.148 -- 146 2763 0.1509 0.1646 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 14.571
f_angle_d 1.075
f_chiral_restr 0.054
f_bond_d 0.007
f_plane_restr 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2175
Nucleic Acid Atoms 0
Heterogen Atoms 32
Solvent Atoms 175

Software

Software
Software Name Purpose
XDS data reduction version: XDSapp 2.0
Aimless data scaling
PHASER phasing
PHENIX refinement version: (1.10.1_2155: ???)