5MZ4

Crystal Structure of full-lengh CSFV NS3/4A


X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion
pH 5.6
Temperature 293.0
Details 12% PEG 3350 250 mM Tri-sodium citrate 100 mM 2-aminoethanesulfonic acid

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 127.21 α = 90
b = 168.84 β = 90
c = 98.5 γ = 90
Symmetry
Space Group P 21 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 293
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS3 S 6M -- 2011-02-25
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID23-1 0.95367 ESRF ID23-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.05 38.95 98.3 0.091 -- -- 5.8 -- 40242 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.05 3.21 93.0 0.482 -- 1.8 2.9 5483

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.048 38.948 -- 1.33 -- 40185 1975 97.51 -- 0.1954 0.1934 0.2327 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.0482 3.1244 -- 56 2371 0.3219 0.3527 -- 84.0
X Ray Diffraction 3.1244 3.2089 -- 195 2664 0.2863 0.3251 -- 98.0
X Ray Diffraction 3.2089 3.3032 -- 61 2808 0.2722 0.294 -- 99.0
X Ray Diffraction 3.3032 3.4098 -- 178 2709 0.2447 0.3148 -- 100.0
X Ray Diffraction 3.4098 3.5316 -- 203 2691 0.2194 0.2682 -- 99.0
X Ray Diffraction 3.5316 3.6729 -- 6 2885 0.2085 0.2785 -- 100.0
X Ray Diffraction 3.6729 3.8399 -- 194 2716 0.1951 0.2826 -- 100.0
X Ray Diffraction 3.8399 4.0422 -- 144 2746 0.1788 0.2134 -- 99.0
X Ray Diffraction 4.0422 4.2951 -- 158 2765 0.1704 0.1914 -- 99.0
X Ray Diffraction 4.2951 4.6263 -- 141 2772 0.1489 0.1926 -- 99.0
X Ray Diffraction 4.6263 5.0909 -- 208 2716 0.154 0.1993 -- 99.0
X Ray Diffraction 5.0909 5.8255 -- 159 2770 0.1763 0.2019 -- 98.0
X Ray Diffraction 5.8255 7.3315 -- 106 2830 0.1976 0.2291 -- 98.0
X Ray Diffraction 7.3315 38.9508 -- 166 2767 0.1844 0.228 -- 93.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_bond_d 0.004
f_angle_d 0.713
f_dihedral_angle_d 14.288
f_chiral_restr 0.048
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 10788
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 10

Software

Software
Software Name Purpose
PHENIX refinement version: (1.10_2155: ???)
XDS data reduction
Aimless data scaling
PHASER phasing