X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8.5
Temperature 291.0
Details 18.8% (w/v) PEG of mean MW 20000, 37.6% (v/v) PEG monomethyl ether of mean MW 500, 50.2 mM Bicine, 43.8 mM Trizma base (pH of buffer mixture: 8.5) and 0.282 M each of the following halogens: Sodium fluoride, Sodium bromide and Sodium iodide

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 112.24 α = 90
b = 143.17 β = 90
c = 148.99 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS3 6M -- 2014-12-06
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I03 0.976 Diamond I03

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.53 40.81 100.0 0.199 -- -- 13.2 -- 80735 -- -- 45.968
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.53 2.6 100.0 -- -- 1.6 13.1 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.53 40.805 -- 1.35 -- 80655 3983 99.98 -- 0.1766 0.1738 0.2292 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.53 2.5609 -- 136 2747 0.2712 0.3171 -- 100.0
X Ray Diffraction 2.5609 2.5933 -- 134 2678 0.2695 0.3285 -- 100.0
X Ray Diffraction 2.5933 2.6274 -- 134 2708 0.2551 0.3497 -- 100.0
X Ray Diffraction 2.6274 2.6634 -- 141 2720 0.2647 0.3225 -- 100.0
X Ray Diffraction 2.6634 2.7014 -- 141 2689 0.2367 0.3015 -- 100.0
X Ray Diffraction 2.7014 2.7417 -- 140 2721 0.2401 0.3319 -- 100.0
X Ray Diffraction 2.7417 2.7846 -- 127 2689 0.2489 0.3056 -- 100.0
X Ray Diffraction 2.7846 2.8302 -- 157 2715 0.2303 0.2978 -- 100.0
X Ray Diffraction 2.8302 2.879 -- 151 2717 0.22 0.311 -- 100.0
X Ray Diffraction 2.879 2.9313 -- 157 2690 0.2192 0.2692 -- 100.0
X Ray Diffraction 2.9313 2.9877 -- 157 2695 0.2243 0.2683 -- 100.0
X Ray Diffraction 2.9877 3.0487 -- 155 2714 0.2152 0.2835 -- 100.0
X Ray Diffraction 3.0487 3.1149 -- 119 2733 0.1933 0.2798 -- 100.0
X Ray Diffraction 3.1149 3.1874 -- 129 2725 0.1949 0.2535 -- 100.0
X Ray Diffraction 3.1874 3.267 -- 147 2706 0.187 0.2724 -- 100.0
X Ray Diffraction 3.267 3.3553 -- 147 2734 0.1935 0.2543 -- 100.0
X Ray Diffraction 3.3553 3.454 -- 149 2736 0.1822 0.2379 -- 100.0
X Ray Diffraction 3.454 3.5654 -- 135 2725 0.1801 0.2801 -- 100.0
X Ray Diffraction 3.5654 3.6928 -- 131 2735 0.1725 0.2479 -- 100.0
X Ray Diffraction 3.6928 3.8405 -- 136 2755 0.1598 0.212 -- 100.0
X Ray Diffraction 3.8405 4.0152 -- 137 2751 0.1542 0.1898 -- 100.0
X Ray Diffraction 4.0152 4.2267 -- 160 2731 0.1412 0.1921 -- 100.0
X Ray Diffraction 4.2267 4.4912 -- 153 2753 0.1345 0.1957 -- 100.0
X Ray Diffraction 4.4912 4.8374 -- 138 2740 0.124 0.1699 -- 100.0
X Ray Diffraction 4.8374 5.3233 -- 124 2825 0.1368 0.191 -- 100.0
X Ray Diffraction 5.3233 6.0914 -- 137 2776 0.1588 0.2119 -- 100.0
X Ray Diffraction 6.0914 7.6662 -- 157 2824 0.1708 0.214 -- 100.0
X Ray Diffraction 7.6662 40.8102 -- 154 2940 0.1557 0.1735 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.073
f_angle_d 1.378
f_dihedral_angle_d 15.619
f_plane_restr 0.006
f_bond_d 0.01
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 14085
Nucleic Acid Atoms 0
Heterogen Atoms 890
Solvent Atoms 240

Software

Software
Software Name Purpose
PHENIX refinement version: 1.8.4_1496
xia2 data reduction
xia2 data scaling
PHASER phasing