X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 285.0
Details 20% polyethylene glycole 6000, 50 mM bis-tris propane pH 7.0, 7% 2 methyl-2,4,-pentanediol, 5% 2 methyl-2 propanal, 6% PEG 5000, cellobiose

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 49.33 α = 87.23
b = 73.23 β = 94.17
c = 91.15 γ = 100.52
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 110
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 6M -- 2014-04-24
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.1 0.91841 BESSY 14.1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.78 48.4 90.0 0.102 -- -- 1.83 -- 107169 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.78 1.83 -- 0.498 -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.85 48.398 -- 1.98 -- 101178 5057 94.77 -- 0.2288 0.2264 0.2731 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.85 1.871 -- 154 2957 0.2773 0.3292 -- 86.0
X Ray Diffraction 1.871 1.893 -- 165 3138 0.2867 0.3529 -- 94.0
X Ray Diffraction 1.893 1.9161 -- 168 3186 0.2819 0.3434 -- 94.0
X Ray Diffraction 1.9161 1.9404 -- 166 3140 0.2747 0.3489 -- 94.0
X Ray Diffraction 1.9404 1.9659 -- 170 3239 0.2706 0.3268 -- 95.0
X Ray Diffraction 1.9659 1.9928 -- 168 3198 0.263 0.3284 -- 95.0
X Ray Diffraction 1.9928 2.0213 -- 169 3208 0.2592 0.3586 -- 95.0
X Ray Diffraction 2.0213 2.0515 -- 168 3177 0.2567 0.2964 -- 94.0
X Ray Diffraction 2.0515 2.0835 -- 166 3157 0.2528 0.2924 -- 94.0
X Ray Diffraction 2.0835 2.1177 -- 169 3207 0.2475 0.3256 -- 94.0
X Ray Diffraction 2.1177 2.1542 -- 168 3195 0.2519 0.2753 -- 95.0
X Ray Diffraction 2.1542 2.1934 -- 164 3124 0.248 0.3098 -- 94.0
X Ray Diffraction 2.1934 2.2356 -- 172 3270 0.2487 0.331 -- 95.0
X Ray Diffraction 2.2356 2.2812 -- 167 3179 0.2496 0.3077 -- 95.0
X Ray Diffraction 2.2812 2.3308 -- 168 3195 0.243 0.3169 -- 95.0
X Ray Diffraction 2.3308 2.385 -- 169 3212 0.239 0.2921 -- 95.0
X Ray Diffraction 2.385 2.4447 -- 172 3258 0.2446 0.3067 -- 96.0
X Ray Diffraction 2.4447 2.5108 -- 169 3217 0.2309 0.2915 -- 96.0
X Ray Diffraction 2.5108 2.5846 -- 171 3256 0.2354 0.2931 -- 96.0
X Ray Diffraction 2.5846 2.6681 -- 169 3203 0.2304 0.2926 -- 95.0
X Ray Diffraction 2.6681 2.7634 -- 172 3260 0.2317 0.2889 -- 96.0
X Ray Diffraction 2.7634 2.874 -- 169 3220 0.2234 0.2591 -- 96.0
X Ray Diffraction 2.874 3.0048 -- 170 3233 0.2285 0.268 -- 96.0
X Ray Diffraction 3.0048 3.1632 -- 172 3257 0.2137 0.2593 -- 96.0
X Ray Diffraction 3.1632 3.3614 -- 168 3221 0.2124 0.2443 -- 96.0
X Ray Diffraction 3.3614 3.6208 -- 171 3249 0.1988 0.2467 -- 96.0
X Ray Diffraction 3.6208 3.985 -- 172 3259 0.1802 0.2132 -- 96.0
X Ray Diffraction 3.985 4.5613 -- 172 3257 0.1666 0.1737 -- 96.0
X Ray Diffraction 4.5613 5.7453 -- 167 3174 0.1963 0.232 -- 95.0
X Ray Diffraction 5.7453 48.4145 -- 172 3275 0.2154 0.2205 -- 96.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.006
f_dihedral_angle_d 11.792
f_chiral_restr 0.045
f_plane_restr 0.004
f_angle_d 0.659
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 9460
Nucleic Acid Atoms 0
Heterogen Atoms 296
Solvent Atoms 1579

Software

Software
Software Name Purpose
PHENIX refinement version: (1.10.1_2155: ???)
XDS data reduction
XDS data scaling
PHASER phasing