X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 289.0
Details 0.2 M Sodium formate, 20% w/v Polyethylene glycol 3350

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 120.28 α = 90
b = 74.59 β = 117.29
c = 118.03 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2014-06-03
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97918 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.75 50 99.6 -- 0.095 -- 3.1 -- 48922 -- -- 45.0
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.75 2.8 99.4 0.798 -- 1.87 2.9 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.75 40.67 -- 1.34 -- 43030 2158 87.6 -- 0.1838 0.1821 0.2175 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.7413 2.8051 -- 61 1190 0.2739 0.2868 -- 39.0
X Ray Diffraction 2.8051 2.8752 -- 90 1545 0.2715 0.3025 -- 50.0
X Ray Diffraction 2.8752 2.9529 -- 128 1983 0.2469 0.3066 -- 65.0
X Ray Diffraction 2.9529 3.0398 -- 127 2371 0.2299 0.2861 -- 77.0
X Ray Diffraction 3.0398 3.1379 -- 151 2794 0.2329 0.2585 -- 90.0
X Ray Diffraction 3.1379 3.25 -- 158 3023 0.2361 0.2451 -- 98.0
X Ray Diffraction 3.25 3.3801 -- 168 3085 0.2216 0.2424 -- 100.0
X Ray Diffraction 3.3801 3.5338 -- 136 3127 0.1941 0.2485 -- 100.0
X Ray Diffraction 3.5338 3.72 -- 156 3090 0.1826 0.1971 -- 100.0
X Ray Diffraction 3.72 3.9529 -- 168 3084 0.1743 0.214 -- 100.0
X Ray Diffraction 3.9529 4.2578 -- 159 3118 0.1551 0.1985 -- 100.0
X Ray Diffraction 4.2578 4.6857 -- 169 3101 0.1367 0.1685 -- 99.0
X Ray Diffraction 4.6857 5.3624 -- 172 3118 0.1443 0.1782 -- 100.0
X Ray Diffraction 5.3624 6.7511 -- 176 3110 0.1846 0.2361 -- 100.0
X Ray Diffraction 6.7511 40.6746 -- 139 3133 0.1687 0.2007 -- 96.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 51.8
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.006
f_dihedral_angle_d 15.707
f_angle_d 0.661
f_bond_d 0.004
f_chiral_restr 0.043
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 7854
Nucleic Acid Atoms 0
Heterogen Atoms 61
Solvent Atoms 100

Software

Software
Software Name Purpose
PHENIX refinement version: (1.10pre_2104: ???)
HKL-3000 data reduction
HKL-3000 data scaling
HKL-3000 phasing