ELECTRON MICROSCOPY Experimental Data



EM Sample
Sample Vitrification Details --
Sample Aggregation State PARTICLE
Sample Reconstruction Method SINGLE PARTICLE
Name of Sample NFS1-ISD11-ISCU-FXN
EM Data Acquisition
Date of Experiment --
Temperature (Kelvin) --
Microscope Model FEI TECNAI F30
Detector Type GATAN ULTRASCAN 4000 (4k x 4k)
Minimum Defocus (nm) 210.0
Maximum Defocus (nm) 3000.0
Minimum Tilt Angle (degrees) --
Maximum Tilt Angle (degrees) --
Nominal CS 2.0
Imaging Mode BRIGHT FIELD
Electron Dose (electrons per Å**-2) 30.0
Illumination Mode OTHER
Nominal Magnification 115000
Calibrated Magnification 115000
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details --
3D Reconstruction
Software Package(s) EMAN2
Reconstruction Method(s) --
EM Image Reconstruction Statistics
Number of Particles 4124
Other Details --
Effective Resolution 14.3
EM Map-Model Fitting and Refinement
Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Fitting Software
REAL RIGID BODY FIT -- -- -- --