X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 300.0
Details sodium chloride

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 45.65 α = 90
b = 57.74 β = 90
c = 86.32 γ = 90
Symmetry
Space Group P 2 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU -- 2015-03-10
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH3R 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 18.8 99.9 -- -- -- 6.37 -- 21795 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
-- -- -- -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.8 17.735 -- 1.34 -- 21750 2000 99.93 -- 0.1808 0.1775 0.213 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8 1.845 -- 139 1374 0.2138 0.2536 -- 100.0
X Ray Diffraction 1.845 1.8948 -- 142 1396 0.203 0.2578 -- 100.0
X Ray Diffraction 1.8948 1.9505 -- 138 1365 0.1852 0.2322 -- 100.0
X Ray Diffraction 1.9505 2.0134 -- 140 1383 0.1724 0.2374 -- 100.0
X Ray Diffraction 2.0134 2.0853 -- 141 1402 0.1719 0.2262 -- 100.0
X Ray Diffraction 2.0853 2.1686 -- 143 1400 0.1801 0.1948 -- 100.0
X Ray Diffraction 2.1686 2.2671 -- 141 1394 0.1749 0.2327 -- 100.0
X Ray Diffraction 2.2671 2.3864 -- 141 1403 0.1874 0.2251 -- 100.0
X Ray Diffraction 2.3864 2.5355 -- 144 1417 0.1945 0.2234 -- 100.0
X Ray Diffraction 2.5355 2.7306 -- 142 1400 0.1855 0.2314 -- 100.0
X Ray Diffraction 2.7306 3.0042 -- 143 1407 0.1884 0.2228 -- 100.0
X Ray Diffraction 3.0042 3.4362 -- 145 1441 0.1754 0.187 -- 100.0
X Ray Diffraction 3.4362 4.3189 -- 147 1452 0.1557 0.1972 -- 100.0
X Ray Diffraction 4.3189 17.7357 -- 154 1516 0.1708 0.1931 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 13.428
f_chiral_restr 0.047
f_angle_d 1.061
f_bond_d 0.007
f_plane_restr 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1510
Nucleic Acid Atoms 0
Heterogen Atoms 41
Solvent Atoms 201

Software

Software
Software Name Purpose
PHENIX refinement version: 1.9_1692
iMOSFLM data reduction version: 7.1.1
Aimless data scaling
PHASER phasing version: 2.1