X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7
Temperature 295.0
Details 0.1 M HEPES pH 7.0, 2.4 M ammonium sulfate

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 34.55 α = 90
b = 39.45 β = 90
c = 102.85 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS HTC -- 2015-10-22
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.54178 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.41 39.46 97.0 -- 0.044 -- 4.6 -- 26998 -- -- 14.74
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.41 1.49 88.1 0.411 -- 3.2 4.4 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.416 28.679 -- 1.36 -- 23994 1999 86.99 -- 0.2193 0.2168 0.2466 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.4158 1.4512 -- 44 490 0.189 0.2233 -- 28.0
X Ray Diffraction 1.4512 1.4904 -- 85 932 0.2063 0.2692 -- 53.0
X Ray Diffraction 1.4904 1.5343 -- 118 1293 0.1864 0.2497 -- 73.0
X Ray Diffraction 1.5343 1.5838 -- 143 1581 0.1826 0.2291 -- 88.0
X Ray Diffraction 1.5838 1.6404 -- 157 1722 0.1997 0.2681 -- 97.0
X Ray Diffraction 1.6404 1.7061 -- 158 1741 0.2221 0.242 -- 98.0
X Ray Diffraction 1.7061 1.7837 -- 160 1754 0.2207 0.2624 -- 98.0
X Ray Diffraction 1.7837 1.8778 -- 158 1743 0.2265 0.2942 -- 97.0
X Ray Diffraction 1.8778 1.9954 -- 152 1678 0.2532 0.2895 -- 94.0
X Ray Diffraction 1.9954 2.1494 -- 161 1771 0.2133 0.2292 -- 99.0
X Ray Diffraction 2.1494 2.3656 -- 159 1752 0.2513 0.3037 -- 96.0
X Ray Diffraction 2.3656 2.7077 -- 163 1789 0.2212 0.2432 -- 98.0
X Ray Diffraction 2.7077 3.4105 -- 165 1824 0.217 0.2256 -- 98.0
X Ray Diffraction 3.4105 28.6844 -- 176 1925 0.199 0.2237 -- 98.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.082
f_plane_restr 0.006
f_dihedral_angle_d 11.547
f_angle_d 1.037
f_bond_d 0.009
Coordinate Error
Parameter Value
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1090
Nucleic Acid Atoms 0
Heterogen Atoms 11
Solvent Atoms 125

Software

Software
Software Name Purpose
PHENIX refinement version: (1.10_2155)
XDS data reduction
XDS data scaling
PHENIX phasing