X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 291.0
Details 31% PEG3350, 125mM NaCl, 0.1M Tris7.5

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 32.73 α = 90
b = 48.28 β = 101.76
c = 51.44 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 325 mm CCD -- 2016-04-22
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL14-1 0.9795 SSRL BL14-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.36 18.79 99.19 0.047 -- -- 4.26 -- 33527 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.36 1.46 99.1 0.54 -- 3.09 4.26 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.36 18.791 -- 1.36 -- 33527 1700 99.19 -- 0.1552 0.1536 0.1833 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.36 1.4 -- 170 2578 0.2113 0.2554 -- 99.0
X Ray Diffraction 1.4 1.4452 -- 85 2701 0.1847 0.2381 -- 99.0
X Ray Diffraction 1.4452 1.4968 -- 170 2643 0.1673 0.241 -- 99.0
X Ray Diffraction 1.4968 1.5567 -- 170 2610 0.1539 0.1985 -- 99.0
X Ray Diffraction 1.5567 1.6275 -- 85 2720 0.1447 0.1989 -- 100.0
X Ray Diffraction 1.6275 1.7133 -- 170 2624 0.1425 0.1814 -- 100.0
X Ray Diffraction 1.7133 1.8206 -- 170 2643 0.1392 0.2045 -- 100.0
X Ray Diffraction 1.8206 1.961 -- 85 2696 0.1395 0.1674 -- 100.0
X Ray Diffraction 1.961 2.1581 -- 170 2652 0.1353 0.187 -- 100.0
X Ray Diffraction 2.1581 2.4698 -- 170 2625 0.1488 0.1898 -- 100.0
X Ray Diffraction 2.4698 3.1094 -- 85 2738 0.1614 0.1791 -- 100.0
X Ray Diffraction 3.1094 18.7928 -- 170 2597 0.1583 0.1656 -- 95.0
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 19.214
f_plane_restr 0.007
f_chiral_restr 0.077
f_bond_d 0.006
f_angle_d 0.879
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1402
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 143

Software

Software
Software Name Purpose
PHENIX refinement version: 1.10_2155
XDS data scaling version: 20151015
PHENIX phasing