X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 301.0
Details 4.5 M NaCl, 0.1 M Tris-HCl, pH7.5

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 117.57 α = 90
b = 117.57 β = 90
c = 91.8 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RAYONIX MX-225 -- 2015-11-11
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.97872 APS 21-ID-F

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 50 100.0 -- -- -- 11.2 -- 49786 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.0 2.11 -- 0.439 -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.0 50.0 -- 1.34 -- 49744 2448 99.94 -- 0.1724 0.1712 0.1938 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.0 2.0408 -- 114 2770 0.1999 0.2352 -- 100.0
X Ray Diffraction 2.0408 2.0852 -- 153 2733 0.1951 0.246 -- 100.0
X Ray Diffraction 2.0852 2.1337 -- 132 2778 0.1847 0.2253 -- 100.0
X Ray Diffraction 2.1337 2.1871 -- 123 2779 0.1848 0.1858 -- 100.0
X Ray Diffraction 2.1871 2.2462 -- 143 2745 0.1814 0.2122 -- 100.0
X Ray Diffraction 2.2462 2.3123 -- 159 2730 0.1818 0.21 -- 100.0
X Ray Diffraction 2.3123 2.387 -- 133 2774 0.187 0.1931 -- 100.0
X Ray Diffraction 2.387 2.4723 -- 140 2774 0.1847 0.2543 -- 100.0
X Ray Diffraction 2.4723 2.5713 -- 153 2761 0.1961 0.2008 -- 100.0
X Ray Diffraction 2.5713 2.6883 -- 156 2755 0.2034 0.2266 -- 100.0
X Ray Diffraction 2.6883 2.83 -- 142 2783 0.2005 0.2061 -- 100.0
X Ray Diffraction 2.83 3.0073 -- 159 2766 0.1976 0.2161 -- 100.0
X Ray Diffraction 3.0073 3.2394 -- 125 2805 0.186 0.2251 -- 100.0
X Ray Diffraction 3.2394 3.5654 -- 139 2814 0.1528 0.1811 -- 100.0
X Ray Diffraction 3.5654 4.0811 -- 157 2783 0.1418 0.1596 -- 100.0
X Ray Diffraction 4.0811 5.141 -- 143 2847 0.1292 0.1425 -- 100.0
X Ray Diffraction 5.141 50.9258 -- 177 2899 0.1758 0.1987 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.003
f_dihedral_angle_d 12.937
f_plane_restr 0.004
f_chiral_restr 0.031
f_angle_d 0.846
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3267
Nucleic Acid Atoms 0
Heterogen Atoms 1
Solvent Atoms 544

Software

Software
Software Name Purpose
PHENIX refinement version: 1.9_1692
iMOSFLM data reduction
SCALA data scaling
PHASER phasing