X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 291.0
Details 0.2 M sodium nitrate, 20% (w/v) PEG 3350.

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 45.21 α = 90
b = 130.33 β = 90
c = 136.71 γ = 90
Symmetry
Space Group P 2 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CMOS RDI CMOS_8M -- 2014-04-30
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 4.2.2 0.979 ALS 4.2.2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 60.53 98.9 0.109 -- -- 7.2 -- 36905 -- -- 30.4
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.3 2.38 99.9 0.899 -- 2.6 7.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.3 47.166 -- 1.35 -- 36825 1812 99.9 -- 0.1837 0.1809 0.2366 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3 2.3622 -- 148 2637 0.278 0.3978 -- 100.0
X Ray Diffraction 2.3622 2.4317 -- 149 2614 0.2296 0.3082 -- 100.0
X Ray Diffraction 2.4317 2.5102 -- 147 2677 0.2056 0.285 -- 100.0
X Ray Diffraction 2.5102 2.5999 -- 145 2597 0.1984 0.3271 -- 100.0
X Ray Diffraction 2.5999 2.704 -- 106 2712 0.1882 0.248 -- 100.0
X Ray Diffraction 2.704 2.8271 -- 124 2713 0.1921 0.2348 -- 100.0
X Ray Diffraction 2.8271 2.9761 -- 145 2641 0.2014 0.2553 -- 100.0
X Ray Diffraction 2.9761 3.1625 -- 130 2663 0.2084 0.2809 -- 100.0
X Ray Diffraction 3.1625 3.4066 -- 125 2700 0.2036 0.2588 -- 100.0
X Ray Diffraction 3.4066 3.7493 -- 150 2706 0.1841 0.2389 -- 100.0
X Ray Diffraction 3.7493 4.2915 -- 127 2725 0.1553 0.2311 -- 100.0
X Ray Diffraction 4.2915 5.4056 -- 179 2719 0.1336 0.165 -- 100.0
X Ray Diffraction 5.4056 47.1755 -- 137 2909 0.1547 0.1693 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.061
f_bond_d 0.014
f_angle_d 1.159
f_dihedral_angle_d 14.214
f_plane_restr 0.007
Coordinate Error
Parameter Value
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5397
Nucleic Acid Atoms 0
Heterogen Atoms 8
Solvent Atoms 391

Software

Software
Software Name Purpose
PHENIX refinement version: (1.10_2155: ???)
XDS data reduction version: VERSION January 10, 2014
XDS data scaling version: VERSION January 10, 2014
PHENIX phasing version: 1.10_2155