X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.5
Temperature 292.0
Details 0.1 M Tris, 2.0 M (NH4)2SO4

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 60.45 α = 90
b = 99.77 β = 103.73
c = 87.65 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD AGILENT EOS CCD -- 2014-03-04
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 1 SSRF BL17U

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.51 39.2 97.6 -- -- -- 3.6 -- 33694 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.51 2.6 -- -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.51 39.16 -- 1.34 -- 33668 1999 97.5 -- 0.222 0.22 0.256 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.5124 2.5752 -- 117 1848 0.3163 0.3428 -- 80.0
X Ray Diffraction 2.5752 2.6448 -- 142 2269 0.2957 0.3524 -- 98.0
X Ray Diffraction 2.6448 2.7226 -- 145 2286 0.2855 0.3552 -- 99.0
X Ray Diffraction 2.7226 2.8104 -- 143 2272 0.2802 0.3531 -- 99.0
X Ray Diffraction 2.8104 2.9109 -- 145 2300 0.2645 0.3214 -- 99.0
X Ray Diffraction 2.9109 3.0274 -- 147 2324 0.2589 0.3189 -- 99.0
X Ray Diffraction 3.0274 3.1651 -- 144 2279 0.2473 0.2286 -- 100.0
X Ray Diffraction 3.1651 3.3319 -- 146 2312 0.2335 0.3104 -- 100.0
X Ray Diffraction 3.3319 3.5405 -- 147 2311 0.2261 0.2767 -- 100.0
X Ray Diffraction 3.5405 3.8137 -- 145 2304 0.1982 0.2544 -- 99.0
X Ray Diffraction 3.8137 4.197 -- 144 2288 0.1881 0.1956 -- 99.0
X Ray Diffraction 4.197 4.8034 -- 144 2271 0.1799 0.2105 -- 98.0
X Ray Diffraction 4.8034 6.0482 -- 146 2325 0.1969 0.2383 -- 99.0
X Ray Diffraction 6.0482 39.1611 -- 144 2280 0.2151 0.2268 -- 96.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.048
f_angle_d 1.278
f_dihedral_angle_d 14.319
f_bond_d 0.01
f_plane_restr 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4308
Nucleic Acid Atoms 0
Heterogen Atoms 99
Solvent Atoms 0

Software

Software
Software Name Purpose
PHENIX refinement version: 1.9_1692
HKL-2000 data reduction
HKL-2000 data scaling
PHENIX phasing