X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
Temperature 293.0
Details 0.09 M NPS mix[NaNO3, Na2HPO4, (NH4)2SO4], 0.1 M buffer mix (Imidazole, Sodium Cacodylate, MES; Bis-Tris) pH 6.5, 37.5% MPD_P1K_P3350 mix(MPD, PEG 1000, PEG 3350)

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 63.87 α = 90
b = 103.75 β = 90
c = 114.84 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2016-03-06
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.97915 SSRF BL17U

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 50 97.6 -- -- -- 8.2 -- 19693 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.2 2.28 92.8 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.2 39.488 -- 1.36 -- 19693 1013 96.13 -- 0.2066 0.2046 0.2464 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.1726 2.2871 -- 118 2290 0.258 0.3168 -- 84.0
X Ray Diffraction 2.2871 2.4304 -- 159 2728 0.2404 0.319 -- 100.0
X Ray Diffraction 2.4304 2.618 -- 159 2732 0.2342 0.2628 -- 100.0
X Ray Diffraction 2.618 2.8814 -- 137 2773 0.2225 0.2571 -- 100.0
X Ray Diffraction 2.8814 3.2982 -- 170 2746 0.2047 0.2446 -- 100.0
X Ray Diffraction 3.2982 4.1546 -- 151 2752 0.1916 0.2244 -- 99.0
X Ray Diffraction 4.1546 39.494 -- 119 2659 0.193 0.2391 -- 91.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.008
f_angle_d 1.046
f_plane_restr 0.006
f_chiral_restr 0.064
f_dihedral_angle_d 33.778
Coordinate Error
Parameter Value
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2820
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 79

Software

Software
Software Name Purpose
PHENIX refinement version: (1.10.1_2155: ???)
HKL-2000 data reduction
HKL-2000 data scaling
HKL-2000 phasing